Highly Accelerated Life Test (HALT) Program at Space Systems Loral

Q4 Engineering
B. Kosinski, D. Cronin
{"title":"Highly Accelerated Life Test (HALT) Program at Space Systems Loral","authors":"B. Kosinski, D. Cronin","doi":"10.17764/jiet.56.2.43g5n424308r4016","DOIUrl":null,"url":null,"abstract":"Highly Accelerated Life Testing (HALT) is used in the commercial electronics industry to improve product robustness prior to starting production. The basic theory is that testing well beyond expected, intended-use environments may uncover design flaws that could become field failures after a product is in production. By fixing issues prior to starting production, costly recalls can be avoided. HALT has proven to be effective, as evidenced by its wide incorporation in the commercial electronics industry. Could HALT also be worth the time and expense of performing on commercial satellite hardware, which is designed to rigorous standards and tested over military-grade environmental test specifications? This paper summarizes Space Systems/Loral's (SS/L) initial experience with HALT, experience over time, and refinement of the traditional HALT process with emphasis on finding the operating limit margins before purposely searching for any failure limits. The methodology used by SS/L has proven to be effective w...","PeriodicalId":35935,"journal":{"name":"Journal of the IEST","volume":"56 1","pages":"1-19"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the IEST","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17764/jiet.56.2.43g5n424308r4016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 1

Abstract

Highly Accelerated Life Testing (HALT) is used in the commercial electronics industry to improve product robustness prior to starting production. The basic theory is that testing well beyond expected, intended-use environments may uncover design flaws that could become field failures after a product is in production. By fixing issues prior to starting production, costly recalls can be avoided. HALT has proven to be effective, as evidenced by its wide incorporation in the commercial electronics industry. Could HALT also be worth the time and expense of performing on commercial satellite hardware, which is designed to rigorous standards and tested over military-grade environmental test specifications? This paper summarizes Space Systems/Loral's (SS/L) initial experience with HALT, experience over time, and refinement of the traditional HALT process with emphasis on finding the operating limit margins before purposely searching for any failure limits. The methodology used by SS/L has proven to be effective w...
太空系统公司的高加速寿命试验(HALT)项目
高加速寿命测试(HALT)用于商业电子工业,在开始生产之前提高产品的稳健性。基本理论是,测试远远超出预期,预期使用环境可能会发现设计缺陷,这些缺陷可能会在产品投入生产后成为现场故障。通过在开始生产之前解决问题,可以避免代价高昂的召回。HALT已被证明是有效的,正如其在商业电子工业中的广泛结合所证明的那样。在商业卫星硬件上执行HALT是否也值得花费时间和金钱?商业卫星硬件的设计符合严格的标准,并通过军用级环境测试规范进行了测试。本文总结了Space Systems/Loral (SS/L)在HALT方面的初步经验,随着时间的推移的经验,以及对传统HALT过程的改进,重点是在有意寻找任何故障限制之前找到操作极限。SS/L采用的方法已被证明是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Journal of the IEST
Journal of the IEST Engineering-Safety, Risk, Reliability and Quality
CiteScore
0.40
自引率
0.00%
发文量
0
期刊介绍: The Journal of the IEST is an official publication of the Institute of Environmental Sciences and Technology and is of archival quality and noncommercial in nature. It was established to advance knowledge through technical articles selected by peer review, and has been published for over 50 years as a benefit to IEST members and the technical community at large as as a permanent record of progress in the science and technology of the environmental sciences
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信