Scanning tunneling microscopy (STM) of graphene

Abstract

Abstract: The use of scanning tunneling microscopy and spectroscopy for the characterization of graphene grown or deposited on different substrates is described. The influence of the substrates on the morphology and electronic structure of graphene is discussed. Experimental methods for the characterization of individual defects on the graphene network are described and studies on the fabrication of graphene nanoribbons and examination of the electronic structure of the edges are outlined.