Valence Band Modification of a (GaxIn1–x)2O3 Solid Solution System Fabricated by Combinatorial Synthesis

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Takahiro Nagata*, Takeshi Hoga, Akihiro Yamashita, Toru Asahi, Shinjiro Yagyu, Toyohiro Chikyow
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引用次数: 7

Abstract

The correlation between the crystal structure and valence band structure of a (GaxIn1–x)2O3 solid solution system was investigated by using combinatorial synthesis. At a low Ga content of (GaxIn1–x)2O3 with a single-phase cubic In2O3 crystal structure, a surface electron accumulation layer (SEAL), which is an important electrical phenomenon in In2O3, was confirmed. When the Ga content increased to approximately x = 0.4, mixed crystal structures of Ga2O3 and In2O3 were produced. Above x = 0.5, the dominant valence band structure was attributed to Ga2O3, the SEAL disappeared, and the sheet resistance increased greatly by 5 orders of magnitude or more. The in-gap state and valence band structure of the (GaxIn1–x)2O3 solid solution system were strongly affected by Ga2O3; however, the valence band maximum position shifted to a higher binding energy.

Abstract Image

组合合成(GaxIn1-x)2O3固溶体体系的价带修饰
采用组合合成方法研究了(GaxIn1-x)2O3固溶体晶体结构与价带结构的关系。在低Ga含量的(GaxIn1-x)2O3单相立方晶体结构下,证实了In2O3中存在一个重要的电现象——表面电子积累层(SEAL)。当Ga含量增加到x = 0.4左右时,形成了Ga2O3和In2O3的混合晶体结构。在x = 0.5以上,Ga2O3为主导价带结构,SEAL消失,片材电阻大幅提高5个数量级以上。Ga2O3对(GaxIn1-x)2O3固溶体的隙内态和价带结构影响较大;然而,价带最大位置向结合能较高的方向移动。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
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