{"title":"Connector Defect Detection Based on Multi-Scale Prototype Residual Feature Fusion","authors":"克林 程","doi":"10.12677/jisp.2023.123032","DOIUrl":null,"url":null,"abstract":"Defect detection is an important part of industrial production, and efficient defect detection me-程克林","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"图像与信号处理","FirstCategoryId":"1093","ListUrlMain":"https://doi.org/10.12677/jisp.2023.123032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Defect detection is an important part of industrial production, and efficient defect detection me-程克林
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