Measurement of the Hygroscopic Swelling Coefficient of Thin Film Polymers Used in Semiconductor Packaging

C. Jang, Samson Yoon, B. Han
{"title":"Measurement of the Hygroscopic Swelling Coefficient of Thin Film Polymers Used in Semiconductor Packaging","authors":"C. Jang, Samson Yoon, B. Han","doi":"10.1109/TCAPT.2009.2038366","DOIUrl":null,"url":null,"abstract":"An advanced method based on the digital image correlation technique is implemented for characterization of hygroscopic swelling of thin film polymers. The accuracy of the proposed method is experimentally validated through a comparison with the well-established Moiré interferometry technique. It is applied to various thin film polymers, including polyimide, solder resist, anisotropic conductive film, and thin woven glass/resin composite. The magnitude of hygroscopic swelling coefficients ranges from 0.067 to 0.25%strain/%wt for those films. A practical guideline for specimen preparation and experimental setup is provided for proper implementation of the proposed method.","PeriodicalId":55013,"journal":{"name":"IEEE Transactions on Components and Packaging Technologies","volume":"33 1","pages":"340-346"},"PeriodicalIF":0.0000,"publicationDate":"2010-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TCAPT.2009.2038366","citationCount":"27","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Components and Packaging Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TCAPT.2009.2038366","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 27

Abstract

An advanced method based on the digital image correlation technique is implemented for characterization of hygroscopic swelling of thin film polymers. The accuracy of the proposed method is experimentally validated through a comparison with the well-established Moiré interferometry technique. It is applied to various thin film polymers, including polyimide, solder resist, anisotropic conductive film, and thin woven glass/resin composite. The magnitude of hygroscopic swelling coefficients ranges from 0.067 to 0.25%strain/%wt for those films. A practical guideline for specimen preparation and experimental setup is provided for proper implementation of the proposed method.
半导体封装用薄膜聚合物吸湿膨胀系数的测量
提出了一种基于数字图像相关技术的薄膜聚合物吸湿膨胀表征方法。通过与已有的莫尔干涉测量技术的比较,验证了该方法的准确性。它适用于各种薄膜聚合物,包括聚酰亚胺,阻焊剂,各向异性导电膜,薄编织玻璃/树脂复合材料。这些薄膜的吸湿膨胀系数范围为0.067 ~ 0.25%strain/%wt。为正确实施所提出的方法提供了试样制备和实验设置的实用指南。
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