Mechanical Reliability of Sn-Ag BGA Solder Joints With Various Electroless Ni-P and Ni-B Plating Layers

Jeong-Won Yoon, Bo-In Noh, Seung-Boo Jung
{"title":"Mechanical Reliability of Sn-Ag BGA Solder Joints With Various Electroless Ni-P and Ni-B Plating Layers","authors":"Jeong-Won Yoon, Bo-In Noh, Seung-Boo Jung","doi":"10.1109/TCAPT.2009.2028134","DOIUrl":null,"url":null,"abstract":"The mechanical reliability of Sn-3.5 wt.%Ag solder joints with four different electroless Ni plating layers [Ni-1B, Ni-3B, Ni-7P, and Ni-10P (in wt.%)] was investigated as a function of aging time up to 60 days at 150° C. The ultimate shear stresses for fracture were higher in the ball shear tests when using Ni-B samples than those with Ni-P metallization if the aging treatment at 150° C was shorter than 15 days, and vice versa when the aging time was higher than 45 days. In all the joints, Ni3Sn4 intermetallic compounds (IMCs) were formed at the interfaces. The thickness of the IMC layer increased with decreasing B or P content, i.e., increasing Ni content. The reaction rate between the Sn-Ag solder and Ni-P was slower than that between the Sn-Ag solder and Ni-B. In the shear test, the failure mode switched from a bulk-related failure (ductile fracture) to an interface-related failure (brittle fracture), depending on the aging time. After prolonged aging treatment, weak solder/Ni3Sn4 interfaces led to a failure mode of brittle fracture for all the solder joints, due to the formation of thick Ni3Sn4 IMCs. The failure for the Sn-Ag/Ni-B joints was more abrupt and brittle due to the formation of the thick, interfacial Ni3Sn4 IMC. The results demonstrated that the Sn-Ag/Ni-P joint was more reliable than the Sn-Ag/Ni-B joint from the viewpoints of interfacial IMC thickness and long-term mechanical reliability.","PeriodicalId":55013,"journal":{"name":"IEEE Transactions on Components and Packaging Technologies","volume":"33 1","pages":"222-228"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TCAPT.2009.2028134","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Components and Packaging Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TCAPT.2009.2028134","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

Abstract

The mechanical reliability of Sn-3.5 wt.%Ag solder joints with four different electroless Ni plating layers [Ni-1B, Ni-3B, Ni-7P, and Ni-10P (in wt.%)] was investigated as a function of aging time up to 60 days at 150° C. The ultimate shear stresses for fracture were higher in the ball shear tests when using Ni-B samples than those with Ni-P metallization if the aging treatment at 150° C was shorter than 15 days, and vice versa when the aging time was higher than 45 days. In all the joints, Ni3Sn4 intermetallic compounds (IMCs) were formed at the interfaces. The thickness of the IMC layer increased with decreasing B or P content, i.e., increasing Ni content. The reaction rate between the Sn-Ag solder and Ni-P was slower than that between the Sn-Ag solder and Ni-B. In the shear test, the failure mode switched from a bulk-related failure (ductile fracture) to an interface-related failure (brittle fracture), depending on the aging time. After prolonged aging treatment, weak solder/Ni3Sn4 interfaces led to a failure mode of brittle fracture for all the solder joints, due to the formation of thick Ni3Sn4 IMCs. The failure for the Sn-Ag/Ni-B joints was more abrupt and brittle due to the formation of the thick, interfacial Ni3Sn4 IMC. The results demonstrated that the Sn-Ag/Ni-P joint was more reliable than the Sn-Ag/Ni-B joint from the viewpoints of interfacial IMC thickness and long-term mechanical reliability.
不同化学镀Ni-P和Ni-B层Sn-Ag BGA焊点的机械可靠性
sn - 3.5的机械可靠性wt. % Ag焊点与四个不同的化学镀镍层(Ni-1B, Ni-3B、Ni-7P Ni-10P (wt. %)]研究了老化时间的函数60天在150°C的终极剪切应力骨折在球高剪切测试当使用Ni-B样本对镍磷金属化比如果时效处理在150°C是短于15天,反之亦然,当老化时间高于45天。在所有接头的界面处均形成了Ni3Sn4金属间化合物(IMCs)。随着B或P含量的降低,即Ni含量的增加,IMC层的厚度增加。Sn-Ag钎料与Ni-P的反应速率比Sn-Ag钎料与Ni-B的反应速率慢。在剪切试验中,根据时效时间的不同,破坏模式从与体相关的破坏(韧性断裂)切换到与界面相关的破坏(脆性断裂)。经过长时间时效处理后,由于形成较厚的Ni3Sn4 imc,弱焊料/Ni3Sn4界面导致所有焊点的失效模式为脆性断裂。由于形成了厚的Ni3Sn4界面IMC, Sn-Ag/Ni-B接头的破坏更为突然和脆性。结果表明,从界面IMC厚度和长期力学可靠性的角度来看,Sn-Ag/Ni-P接头比Sn-Ag/Ni-B接头更可靠。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信