Design of SH Aging Sensor for Real Time and Application in Sensing Network

IF 1.7 Q2 Engineering
Zhang Yuejun, Luan Zhicun, Ding Dailu, Wang Pengjun, Li Zhen, Li Liwei
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引用次数: 2

Abstract

One of the most important issues in deep nanoscale regime CMOS circuits is related to the time-dependent performance degradation caused by negative bias temperature instability (NBTI). The integration of online aging sensor is becoming attractive methodologies in monitoring performance degradation of circuit. The sensor can generate a warning signal, early warning of the occurrence of aging faults, to avoid unnecessary losses. To accurately capture the aging fault, a real-time aging sensor is proposed with mirror extraction setup and hold (SH) time method. The proposed aging sensor, which is on the basis of the standard flip-flop (FF), consists of an additional edge detector circuit, a detection window generator circuit, and an output warning circuit. Having the adaptive characteristic of detection window, aging sensor is able to adjust its NBTI effects and improve the stability. Also, the sensing network supports multiple paths online detection from many SH sensors for IP chip applications. Finally, the Camellia IP layout is inserted with 20 aging sensors and is implemented under 65-nm CMOS process. Experimental results demonstrate the effectiveness of area, power, and performance overheads. Compared with other state of the art, hardware efficiency is increased by 46%, and energy is decreased by about 37%.
实时SH老化传感器的设计及在传感网络中的应用
深纳米级CMOS电路中最重要的问题之一是由负偏置温度不稳定性(NBTI)引起的时间依赖性性能下降。集成在线老化传感器已成为监测电路性能退化的重要方法。该传感器可以产生预警信号,提前预警老化故障的发生,避免不必要的损失。为了准确捕获老化故障,提出了一种基于镜像提取设置和保持时间(SH)方法的实时老化传感器。该老化传感器以标准触发器(FF)为基础,由附加的边缘检测器电路、检测窗口产生电路和输出报警电路组成。老化传感器具有检测窗口的自适应特性,能够调整其NBTI效应,提高稳定性。此外,传感网络支持多路径在线检测来自许多SH传感器的IP芯片应用。最后,在Camellia IP布局中插入20个老化传感器,并在65纳米CMOS工艺下实现。实验结果证明了面积、功率和性能开销的有效性。与其他先进技术相比,硬件效率提高了46%,能量降低了约37%。
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来源期刊
自引率
0.00%
发文量
27
期刊介绍: The Canadian Journal of Electrical and Computer Engineering (ISSN-0840-8688), issued quarterly, has been publishing high-quality refereed scientific papers in all areas of electrical and computer engineering since 1976
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