Advanced UV-fluorescence image analysis for early detection of PV-power degradation

IF 1.9 Q3 PHYSICS, APPLIED
L. Neumaier, G. Eder, Yuliya Voronko, K. Berger, G. Ujvari, K. Knöbl
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引用次数: 2

Abstract

Reliability and durability of photovoltaic modules are a key factor for the development of emerging PV markets worldwide. Reliability is directly dependent on the chemical and physical stability of the polymeric encapsulation materials. One method capable of detecting ageing effects of the polymeric encapsulant directly on-site is UltraViolet Fluorescence (UVF) imaging. This work deals with advanced imaging analysis of UVF images and the subsequent correlation to electrical parameters of PV modules, which were exposed to climate-specific, long-term, accelerated aging procedures. For establishing a correlation, a so called UVF area ratio was established, resulting from the typical fluorescence patterns of the encapsulant material, which arise due to stress impact (e.g., water vapor ingress, elevated temperature, irradiation) and aging/degradation processes. Results of the data analysis show a clear correlation of the UVF area ratios and the electrical parameters with increasing aging time. In particular, the relationship between power and series resistance could be confirmed by extensive long-term test series with different climate-specific aging processes. Assuming the same type of polymeric encapsulation and backsheet and a comparable climate, determining the UVF area ratio can be used to estimate the service life and electrical power dissipation of each module installed in a PV array.
先进的紫外荧光图像分析,用于早期检测光伏功率退化
光伏组件的可靠性和耐用性是全球新兴光伏市场发展的关键因素。可靠性直接取决于聚合物封装材料的化学和物理稳定性。一种能够直接现场检测聚合物封装剂老化效应的方法是紫外荧光(UVF)成像。这项工作涉及UVF图像的高级成像分析以及随后与光伏组件电气参数的相关性,这些组件暴露于特定气候,长期,加速老化程序中。为了建立相关性,建立了所谓的UVF面积比,这是由封装材料的典型荧光模式产生的,这种荧光模式是由于应力影响(例如,水蒸气进入、温度升高、辐照)和老化/降解过程引起的。数据分析结果表明,随着老化时间的增加,UVF面积比和电学参数有明显的相关性。特别是,功率与串联电阻之间的关系可以通过不同气候老化过程的大量长期试验系列来确定。假设相同类型的聚合物封装和背板以及类似的气候,确定UVF面积比可用于估计PV阵列中安装的每个模块的使用寿命和功耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
EPJ Photovoltaics
EPJ Photovoltaics PHYSICS, APPLIED-
CiteScore
2.30
自引率
4.00%
发文量
15
审稿时长
8 weeks
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