Holographic Interferometry of Thin-walled Structure Distortion During the Stereolithography Process

Abstract

The present paper aimed at experimental study for the distortion of geometrical shape of thin walled structures manufactured by stereolithography technologies. It is proposed that total distortion occurring due to layer-by-layer photopolymerisation can be estimate using experimental data about distortion caused by curing single intermediate or final layer. The experiments used a sample in the form of a hollow cube. The distortion of the cube is recorded using time-average holographic interferometry.