Atomic force microscopy for transition metals and tip structure effects

Abstract

We study the influence of tip morphology on the contrast in atomic force microscopy (AFM) for transition metals tips and samples (T/S). For this, we consider a model based on the real space tight binding approach taking into account the electronic structure of the T/S system. Images of an W(001) surface obtained with atomically sharp or blunt tips are considered. The resolution of AFM images, in the attractive force range, is discussed for monatomic (multiatomic) apex(es) tips. Images of clusters deposited on the W(001) surface are also obtained.