{"title":"An envelope method for determination of the optical constants of absorptive films on absorptive substrates","authors":"D.B. Kushev, N.N. Zheleva, M.I. Gyulmezov, M.H. Koparanova","doi":"10.1016/0020-0891(93)90005-R","DOIUrl":null,"url":null,"abstract":"<div><p>A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.</p></div>","PeriodicalId":81524,"journal":{"name":"Infrared physics","volume":"34 2","pages":"Pages 163-167"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0020-0891(93)90005-R","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared physics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/002008919390005R","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.