An envelope method for determination of the optical constants of absorptive films on absorptive substrates

D.B. Kushev, N.N. Zheleva, M.I. Gyulmezov, M.H. Koparanova
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引用次数: 7

Abstract

A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.

测定吸收基底上吸收膜光学常数的包络法
从前反射率的干涉极值推导光学常数的包络法的一个简单变体,被推广到强吸收衬底上的吸收膜的情况。将包络法应用于金属衬底上SnTe外延层的实验光谱。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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