{"title":"A repair-oriented approach to product consistency in product lines using negative variability","authors":"Thomas Buchmann, Felix Schwägerl","doi":"10.1007/s00450-016-0329-0","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":41265,"journal":{"name":"SICS Software-Intensive Cyber-Physical Systems","volume":null,"pages":null},"PeriodicalIF":2.4000,"publicationDate":"2016-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s00450-016-0329-0","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SICS Software-Intensive Cyber-Physical Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s00450-016-0329-0","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Computer Science","Score":null,"Total":0}
引用次数: 4