Application of graph neural network and feature information enhancement in relation inference of sparse knowledge graph

Q1 Engineering
Hai-Tao Jia , Bo-Yang Zhang , Chao Huang , Wen-Han Li , Wen-Bo Xu , Yu-Feng Bi , Li Ren
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引用次数: 0

Abstract

At present, knowledge embedding methods are widely used in the field of knowledge graph (KG) reasoning, and have been successfully applied to those with large entities and relationships. However, in research and production environments, there are a large number of KGs with a small number of entities and relations, which are called sparse KGs. Limited by the performance of knowledge extraction methods or some other reasons (some common-sense information does not appear in the natural corpus), the relation between entities is often incomplete. To solve this problem, a method of the graph neural network and information enhancement is proposed. The improved method increases the mean reciprocal rank (MRR) and Hit@3 by 1.6% and 1.7%, respectively, when the sparsity of the FB15K-237 dataset is 10%. When the sparsity is 50%, the evaluation indexes MRR and Hit@10 are increased by 0.8% and 1.8%, respectively.

图神经网络与特征信息增强在稀疏知识图关系推理中的应用
目前,知识嵌入方法在知识图推理领域得到了广泛的应用,并已成功应用于具有大型实体和关系的推理。然而,在研究和生产环境中,存在大量的KGs,而实体和关系很少,这被称为稀疏KGs。受限于知识提取方法的性能或其他一些原因(一些常识性信息没有出现在自然语料库中),实体之间的关系往往是不完整的。为了解决这个问题,提出了一种图神经网络和信息增强的方法。改进的方法提高了平均倒数排名(MRR)Hit@3当FB15K-237数据集的稀疏性为10%时,分别降低了1.6%和1.7%。当稀疏性为50%时,评价指标MRR和Hit@10分别提高0.8%和1.8%。
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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