Combining Receiver Damaged by Beaulieu-Xie Fading and Rician Co-Channel Interference with a Purpose of Machine Learning QoS Level Prediction

IF 0.9 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
S. Suljovic, D. Krstić, Goran Nestorovic, N. Petrovic, Sinisa Minic, D. Gurjar
{"title":"Combining Receiver Damaged by Beaulieu-Xie Fading and Rician Co-Channel Interference with a Purpose of Machine Learning QoS Level Prediction","authors":"S. Suljovic, D. Krstić, Goran Nestorovic, N. Petrovic, Sinisa Minic, D. Gurjar","doi":"10.5755/j02.eie.34018","DOIUrl":null,"url":null,"abstract":"In this paper, a wireless system is considered impacted by Beaulieu-Xie (BX) fading and Rician co-channel interference (CCI). A selection diversity combining technique is used to combat multi-path fading and CCI effects. The expression for the level crossing rate (LCR) is formulated for the receiver with more input branches, and the corresponding curves that have dependence on the signal-to-interference ratio (SIR) are drawn. On the basis of the presented graphs, we quantify the amount of LCR affected by the presence of fading and interference. Additionally, we propose a classification-based predictive model which leverages the previously calculated LCR value as one of inputs among other variables (number of users, base station, the day of the week) with the aim of Quality of Service (QoS) level prediction.","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":" ","pages":""},"PeriodicalIF":0.9000,"publicationDate":"2023-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Elektronika Ir Elektrotechnika","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.5755/j02.eie.34018","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1

Abstract

In this paper, a wireless system is considered impacted by Beaulieu-Xie (BX) fading and Rician co-channel interference (CCI). A selection diversity combining technique is used to combat multi-path fading and CCI effects. The expression for the level crossing rate (LCR) is formulated for the receiver with more input branches, and the corresponding curves that have dependence on the signal-to-interference ratio (SIR) are drawn. On the basis of the presented graphs, we quantify the amount of LCR affected by the presence of fading and interference. Additionally, we propose a classification-based predictive model which leverages the previously calculated LCR value as one of inputs among other variables (number of users, base station, the day of the week) with the aim of Quality of Service (QoS) level prediction.
结合Beaulieu Xie Fading和Rician同信道干扰损坏的接收机进行机器学习QoS水平预测
本文考虑了Beaulieu Xie(BX)衰落和Rician同信道干扰(CCI)对无线系统的影响。选择分集组合技术用于对抗多径衰落和CCI效应。针对具有更多输入支路的接收机,推导了电平交叉率(LCR)的表达式,并绘制了与信干比(SIR)相关的相应曲线。在给出的图的基础上,我们量化了受衰落和干扰影响的LCR的数量。此外,我们提出了一种基于分类的预测模型,该模型利用先前计算的LCR值作为其他变量(用户数量、基站、一周中的哪一天)中的一个输入,目的是预测服务质量(QoS)水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Elektronika Ir Elektrotechnika
Elektronika Ir Elektrotechnika 工程技术-工程:电子与电气
CiteScore
2.40
自引率
7.70%
发文量
44
审稿时长
24 months
期刊介绍: The journal aims to attract original research papers on featuring practical developments in the field of electronics and electrical engineering. The journal seeks to publish research progress in the field of electronics and electrical engineering with an emphasis on the applied rather than the theoretical in as much detail as possible. The journal publishes regular papers dealing with the following areas, but not limited to: Electronics; Electronic Measurements; Signal Technology; Microelectronics; High Frequency Technology, Microwaves. Electrical Engineering; Renewable Energy; Automation, Robotics; Telecommunications Engineering.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信