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Fraud detection support vector machines with a functional predictor: application to defective wafer detection problem

IF 0.2 Q4 STATISTICS & PROBABILITY
Korean Journal of Applied Statistics Pub Date : 2022-10-31 DOI:10.5351/kjas.2022.35.5.593
Minhyoung Park, S. Shin
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来源期刊
Korean Journal of Applied Statistics
Korean Journal of Applied Statistics STATISTICS & PROBABILITY-
自引率
50.00%
发文量
17
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