V. Karatayev, L. Rudstam, A. Karatayev, L. Burlakova, B. Adamovich, H. Zhukava, K. Holeck, A. Hetherington, J. Jackson, C. Balogh, Z. Serfőző, Christopher W. Hotaling, T. Zhukova, T. M. Mikheyeva, R. Z. Kovalevskaya, O. Makarevich, Darya V. Kruk
{"title":"Time Scales of Ecosystem Impacts and Recovery Under Individual and Serial Invasions","authors":"V. Karatayev, L. Rudstam, A. Karatayev, L. Burlakova, B. Adamovich, H. Zhukava, K. Holeck, A. Hetherington, J. Jackson, C. Balogh, Z. Serfőző, Christopher W. Hotaling, T. Zhukova, T. M. Mikheyeva, R. Z. Kovalevskaya, O. Makarevich, Darya V. Kruk","doi":"10.1007/s10021-023-00828-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2023-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"93","ListUrlMain":"https://doi.org/10.1007/s10021-023-00828-2","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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