New Quartz And Zircon Si Isotopic Reference Materials For Precise And Accurate SIMS Isotopic Microanalysis

IF 3.4 2区化学 Q1 SPECTROSCOPY

Atomic Spectroscopy Pub Date : 2022-04-27 DOI:10.46770/as.2021.1110

Yu Liu, Xian‐Hua Li

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引用次数: 4

Abstract

Here we report the Si isotope compositions of four potential reference materials, including one fused quartz glass (Glass-Qtz), one natural quartz (Qinghu-Qtz), and two natural zircons (Qinghu-Zir and Penglai-Zir), suitable for in-situ Si isotopic microanalysis. Repeated SIMS (Secondary Ion Mass Spectrometry) analyses demonstrate that these materials are more homogeneous in Si isotopes (with the spot-to-spot uncertainty of 0.090-0.102‰), compared with the widely used NIST RM 8546 (previously NBS-28) quartz standard (with the spot-to-spot uncertainty poorer than 0.16‰). Based on the solution-MC-ICP-MS determination, the recommended 𝛿30Si values are −0.10 ± 0.04 ‰ (2SD), −0.03 ± 0.05 ‰ (2SD), −0.45 ± 0.06 ‰ (2SD), and −0.34 ± 0.06 ‰ (2SD), for Glass-Qtz, Qinghu-Qtz, Qinghu-Zir, and Penglai-Zir, respectively. Our results reveal no detectable matrix effect on SIMS Si isotopic microanalysis between the fused quartz glass (Glass-Qtz) and natural quartz (Qinghu-Qtz) standards. Therefore, we propose that this synthetic quartz glass may be used as an alternative, more homogenous standard for SIMS Si isotopic microanalysis of natural quartz samples.

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用于精确SIMS同位素微分析的新型石英和锆石硅同位素参考材料

本文报道了一种熔融石英玻璃(glass - qtz)、一种天然石英(Qinghu-Qtz)和两种天然锆石(Qinghu-Zir和蓬莱- zir)适合原位硅同位素微分析的4种潜在参考物质的Si同位素组成。重复SIMS(次级离子质谱)分析表明，与广泛使用的NIST RM 8546(以前的NBS-28)石英标准(点对点不确定度小于0.16‰)相比，这些材料的Si同位素更加均匀(点对点不确定度为0.090-0.102‰)。通过溶液- mc - icp - ms测定，Glass-Qtz、Qinghu-Qtz、Qinghu-Zir和蓬莱- zir的推荐𝛿30Si值分别为- 0.10±0.04‰(2SD)、- 0.03±0.05‰(2SD)、- 0.45±0.06‰(2SD)和- 0.34±0.06‰(2SD)。我们的研究结果表明，熔融石英玻璃(glass - qtz)和天然石英(Qinghu-Qtz)的SIMS Si同位素微分析没有检测到基质效应。因此，我们建议这种合成石英玻璃可以作为天然石英样品的SIMS Si同位素微分析的替代，更均匀的标准。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Atomic Spectroscopy 物理-光谱学

CiteScore

5.30

自引率

14.70%

发文量

审稿时长

4.5 months

期刊介绍： The ATOMIC SPECTROSCOPY is a peer-reviewed international journal started in 1962 by Dr. Walter Slavin and now is published by Atomic Spectroscopy Press Limited (ASPL). It is intended for the rapid publication of both original articles and review articles in the fields of AAS, AFS, ICP-OES, ICP-MS, GD-MS, TIMS, SIMS, AMS, LIBS, XRF and related techniques. Manuscripts dealing with (i) instrumentation & fundamentals, (ii) methodology development & applications, and (iii) standard reference materials (SRMs) development can be submitted for publication.