Entire-Domain Basis Function with Segmented Edge Condition Applied for Scattering Structures

Q3 Engineering
E. Schlosser, M. Heckler, J. Bergmann
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引用次数: 0

Abstract

Abstract This paper proposes the formulation of a sinusoidal basis function with a novel segmented edge condition to model the impulsive behavior of the surface electric current density at the edges of rectangular microstrip scatterers. In comparison to traditional basis functions, the one considered in this approach demands using very few modes to expand the induced current. The effectiveness of the proposed formulation is validated using the commercial electromagnetic simulator Ansys Designer. Good agreement between the results obtained with the proposed formulation and with the commercial software has been obtained.
具有分段边缘条件的整个域基函数在散射结构中的应用
摘要本文提出了一种具有新的分段边缘条件的正弦基函数的公式,以模拟矩形微带散射体边缘表面电流密度的脉冲行为。与传统的基函数相比,该方法中考虑的基函数要求使用很少的模式来扩展感应电流。使用商业电磁模拟器Ansys Designer验证了所提出公式的有效性。用所提出的公式和商业软件获得的结果之间取得了良好的一致性。
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来源期刊
Journal of Microwaves, Optoelectronics and Electromagnetic Applications
Journal of Microwaves, Optoelectronics and Electromagnetic Applications Engineering-Electrical and Electronic Engineering
CiteScore
1.70
自引率
0.00%
发文量
32
审稿时长
24 weeks
期刊介绍: The Journal of Microwaves, Optoelectronics and Electromagnetic Applications (JMOe), published by the Brazilian Microwave and Optoelectronics Society (SBMO) and Brazilian Society of Electromagnetism (SBMag), is a professional, refereed publication devoted to disseminating technical information in the areas of Microwaves, Optoelectronics, Photonics, and Electromagnetic Applications. Authors are invited to submit original work in one or more of the following topics. Electromagnetic Field Analysis[...] Computer Aided Design [...] Microwave Technologies [...] Photonic Technologies [...] Packaging, Integration and Test [...] Millimeter Wave Technologies [...] Electromagnetic Applications[...] Other Topics [...] Antennas [...] Articles in all aspects of microwave, optoelectronics, photonic devices and applications will be covered in the journal. All submitted papers will be peer-reviewed under supervision of the editors and the editorial board.
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