Surface versus Performance Trade-offs: A Review of Layout Techniques

Q4 Engineering
Pietro Maris Ferreira, Emilie Avignon-Meseldzija, P. Bénabès, Francis Trélin
{"title":"Surface versus Performance Trade-offs: A Review of Layout Techniques","authors":"Pietro Maris Ferreira, Emilie Avignon-Meseldzija, P. Bénabès, Francis Trélin","doi":"10.29292/jics.v17i1.589","DOIUrl":null,"url":null,"abstract":"Selecting the relevant layout techniques is a key point to obtain a high-performance integrated circuit. Most of the common layout techniques, beside allowing the improvement of performance, also leads to an area overhead. Moreover, this area overhead is generally not accurately evaluated. It is proposed in this review to analyze and to evaluate the surface versus performance trade-off in three types of circuits : digital, low-frequency and radiofrequency analog circuits. Each circuit is post-layout simulated using BiCMOS SiGe 55 nm technology from STMicroelectronics. The first analysis evaluates the surface, power consumption and speed trade-off in a digital circuit implementing a 16-bit gray counter, when selecting different combinations of gates from the B55 digital library. The second analysis focuses on the implementation of an accurate capacitor ratio for switched capacitor circuits and quantifies the surface versus accuracy performance. The third analysis evaluate the performance trade-off for six different layout techniques applied on a negative resistor required for a VCO.","PeriodicalId":39974,"journal":{"name":"Journal of Integrated Circuits and Systems","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29292/jics.v17i1.589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 2

Abstract

Selecting the relevant layout techniques is a key point to obtain a high-performance integrated circuit. Most of the common layout techniques, beside allowing the improvement of performance, also leads to an area overhead. Moreover, this area overhead is generally not accurately evaluated. It is proposed in this review to analyze and to evaluate the surface versus performance trade-off in three types of circuits : digital, low-frequency and radiofrequency analog circuits. Each circuit is post-layout simulated using BiCMOS SiGe 55 nm technology from STMicroelectronics. The first analysis evaluates the surface, power consumption and speed trade-off in a digital circuit implementing a 16-bit gray counter, when selecting different combinations of gates from the B55 digital library. The second analysis focuses on the implementation of an accurate capacitor ratio for switched capacitor circuits and quantifies the surface versus accuracy performance. The third analysis evaluate the performance trade-off for six different layout techniques applied on a negative resistor required for a VCO.
表面与性能的权衡:布局技术综述
选择相关的布局技术是获得高性能集成电路的关键。大多数常见的布局技术除了可以提高性能外,还会导致区域开销。此外,该区域开销通常不会得到准确评估。本文建议分析和评估三种类型电路的表面与性能的权衡:数字电路、低频电路和射频模拟电路。使用STMicroelectronics的BiCMOS SiGe 55nm技术对每个电路进行后布局模拟。当从B55数字库中选择不同的门组合时,第一种分析评估了实现16位灰度计数器的数字电路中的表面、功耗和速度权衡。第二种分析侧重于开关电容器电路的精确电容器比的实现,并量化表面与精度的性能。第三种分析评估了VCO所需的负电阻器上应用的六种不同布局技术的性能权衡。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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