The Radiation Resistance of Microelectronic Devices under the Combined Influence of Destabilizing Factors of Space at the Design Stage

IF 0.6 4区物理与天体物理 Q4 ASTRONOMY & ASTROPHYSICS

Cosmic Research Pub Date : 2023-05-25 DOI:10.1134/S0010952523700260

P. I. Didyk, A. Zhukov

引用次数: 0

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设计阶段空间不稳定因素综合影响下微电子器件的抗辐射性能

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Cosmic Research 地学天文-工程：宇航

CiteScore

1.10

自引率

33.30%

发文量

审稿时长

6-12 weeks

期刊介绍： Cosmic Research publishes scientific papers covering all subjects of space science and technology, including the following: ballistics, flight dynamics of the Earth’s artificial satellites and automatic interplanetary stations; problems of transatmospheric descent; design and structure of spacecraft and scientific research instrumentation; life support systems and radiation safety of manned spacecrafts; exploration of the Earth from Space; exploration of near space; exploration of the Sun, planets, secondary planets, and interplanetary medium; exploration of stars, nebulae, interstellar medium, galaxies, and quasars from spacecraft; and various astrophysical problems related to space exploration. A chronicle of scientific events and other notices concerning the main topics of the journal are also presented.