Guest Editors' Words

Q4 Engineering
Fernanda Lima Kastensmidt, S. C. Asensi
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引用次数: 0

Abstract

This Special Issues brings four invited papers that describe the state of the art techniques to improve fault tolerance on complex designs. Integrated circuits operating under radiation can experience undesirable faults that must be evaluated and mitigated. Mitigation can be implemented by redundancy in hardware or in software, and by selecting and protecting the most critical parts of the system.  Radiation effects test and analysis also play an important step in identifying the criticality of the system and helping designers to better apply fault mitigation techniques.
特邀编辑的话
本期特刊带来了四篇受邀论文,介绍了提高复杂设计容错能力的最新技术。在辐射下运行的集成电路可能会出现不良故障,必须对其进行评估并加以缓解。缓解措施可以通过硬件或软件中的冗余以及选择和保护系统的最关键部分来实现。辐射效应测试和分析在识别系统的关键性和帮助设计者更好地应用故障缓解技术方面也发挥着重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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