K. Yu, Yan Chen, Jiawei Liu, Xi Yang, S. Wen, Zhufeng Yue
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引用次数: 0
Abstract
Abstract Micron-sized particles are prone to deposit on smooth surfaces. A micron-sized particle collision-deposition model including the effects of electrostatic forces, integrated with the factors of particle size, material properties, elastic–plastic deformation, particle charging, surface roughness, and van der Waals forces, is proposed. The effects of the electrostatic forces on the critical deposition velocity, collision duration, and coefficient of restitution (COR), which is the ratio of particle velocity after and before the collision, are investigated for 1–20 μm sand particles colliding with glass, steel, and aluminum alloy surfaces. The results show that the electrostatic forces of sand particles are approximately 106–108 times their gravity and increase the impact duration. Moreover, these forces increase the critical deposition velocity by 2.32–6.89% for the glass surface and decrease the COR by 0.6–3.5% for the three surfaces, while the particle size is below 20 μm and the roughness is 1 nm. The electrostatic forces ranked from the maximum to the minimum are those of the aluminum alloy, steel, and glass surfaces for the same particle size and surface roughness. The developed model can perfect the theory of particle flow and gas-particle two-phase flow.
期刊介绍:
Particulate Science and Technology, an interdisciplinary journal, publishes papers on both fundamental and applied science and technology related to particles and particle systems in size scales from nanometers to millimeters. The journal''s primary focus is to report emerging technologies and advances in different fields of engineering, energy, biomaterials, and pharmaceutical science involving particles, and to bring institutional researchers closer to professionals in industries.
Particulate Science and Technology invites articles reporting original contributions and review papers, in particular critical reviews, that are relevant and timely to the emerging and growing fields of particle and powder technology.