Synthesis, optical and AC electrical characteristics of nanocomposites (Bi2O3/ZnO) films prepared by thermal evaporation technique

IF 1 4区 材料科学 Q4 MATERIALS SCIENCE, MULTIDISCIPLINARY
H. S. Suhail, A. R. Abdulridha
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引用次数: 0

Abstract

In this paper, pure bismuth oxide (Bi2O3) and ZnO-doped with a ratio of (0, 0.12, 0.24, 0.36 and 0.48 wt.%) thin films are prepared by thermal evaporation methods under pressure 1×10-7 bar with a rate of deposition 0.5 nm.s-1 , at ambient temperature on glass substrates (RT) with thickness 50 nm and annealed at temperature 573 K for 2 hours. The phase structures of Bi2O3 (monoclinic) and Bi2O3/ZnO NCPs are confirmed by X-ray diffraction (XRD) investigation. The concentration of ZnO-doping reduces the average crystallite size from 17,35 nm to 8.67 nm. Moreover, using XRD data, the average strain, stress, and dislocation density values are computed. The spectroscopy techniques such as Fourier transform infrared (FT-IR) and scanning electron microscopy with field emission probes were used to examine the structures. The FT-IR results showed no chemical interactions between the (Bi2O3/ZnO) NPs. The results of the field emission-scanning electron microscope (FE-SEM) analysis the (Bi2O3/ZnO) NPs were distributed uniformly throughout. The actually result of optical characteristics for (Bi2O3/ZnO) showed that the absorbance, and absorption coefficient, increase with the increased concentrations of (ZnO). At the same time, the transmittance and energy band gaps were decreased with a rise in concentrations (ZnO) that have a high ability to absorb UV-light. The dielectric characteristics were checked in the frequency range from 100 Hz to 5 MHz. The results of the insulating characteristics showed that the dielectric constant and the dielectric loss of thin films (Bi2O3/ZnO) decreased with increasing frequency. In contrast, they increase when the concentration of (ZnO NPs) increases. The A.C conductivity of the thin films (Bi2O3/ZnO) increases with the frequency and concentration of (ZnO) NPs. Finally, the structural and insulating results the indicated characteristics of the (Bi2O3/ZnO) thin films may be helpful in various nano-electronic devices and sensors.
热蒸发法制备纳米复合材料(Bi2O3/ZnO)薄膜的合成、光学和交流电特性
本文采用热蒸发法,在1×10-7巴的压力下,在环境温度下,在厚度为50nm的玻璃衬底(RT)上,以0.5nms-1的沉积速率,制备了掺杂比例为(0.12、0.24、0.36和0.48wt.%)的纯氧化铋(Bi2O3)和ZnO薄膜,并在573K的温度下退火2小时。通过X射线衍射(XRD)研究证实了Bi2O3(单斜晶)和Bi2O3/ZnO NCPs的相结构。ZnO掺杂的浓度使平均晶粒尺寸从17,35nm减小到8.67nm。此外,使用XRD数据,计算了平均应变、应力和位错密度值。利用傅立叶变换红外光谱(FT-IR)和场发射探针扫描电子显微镜等光谱技术对其结构进行了研究。FT-IR结果显示(Bi2O3/ZnO)NP之间没有化学相互作用。场发射扫描电子显微镜(FE-SEM)分析的结果表明,(Bi2O3/ZnO)NP均匀分布。(Bi2O3/ZnO)光学特性的实际结果表明,随着(ZnO)浓度的增加,吸光率和吸收系数增加。同时,透射率和能带隙随着具有高吸收紫外线能力的浓度(ZnO)的增加而降低。在从100Hz到5MHz的频率范围内检查介电特性。绝缘特性的结果表明,薄膜(Bi2O3/ZnO)的介电常数和介电损耗随着频率的增加而降低。相反,当(ZnO NPs)的浓度增加时,它们增加。薄膜(Bi2O3/ZnO)的交流电导率随着(ZnO)NPs的频率和浓度的增加而增加。最后,结构和绝缘结果表明(Bi2O3/ZnO)薄膜的所示特性可能有助于各种纳米电子器件和传感器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Digest Journal of Nanomaterials and Biostructures
Digest Journal of Nanomaterials and Biostructures 工程技术-材料科学:综合
CiteScore
1.50
自引率
22.20%
发文量
116
审稿时长
4.3 months
期刊介绍: Under the aegis of the Academy of Romanian Scientists Edited by: -Virtual Institute of Physics operated by Virtual Company of Physics.
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