THE INFLUENCE OF A POTENTIAL BARRIER ON THE MECHANISMS OF EXCITATION OF OWN FLUCTUATIONS IN RADIO PRODUCTS IN CONDITIONS OF EXPOSURE TO ELECTROMAGNETIC RADIATION

A. Serkov, V. Breslavets, Ju. Breslavets, I. Yakovenko
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引用次数: 2

Abstract

The subject matter is the processes of analysis and the mechanisms of the emergence of their own fluctuations in the semiconductor complex electro -radio devices (communications equipment), if there are currents and voltages entrusted with pulsed electromagnetic radiation, the results obtained in the work of the potential barrier on the border of the semi -conductive structure on the border of the semiconductor (voltage ampere) characteristics of a electro -radio device. The aim is model of transforming the energy of the flow of charged particles, induced by external electromagnetic radiation, into the energy of its own fluctuations in the semiconductor structure, taking into account the properties of the structure itself (heterogeneity of potential at the border). The implementation of this model is due to the effect of transitional radiation of moving charges, when the particle flow crosses the boundary of the media section with various electromagnetic properties (dielectric permeability) and part of its energy is transformed into the energy of its own fluctuations in the semiconductor structure. The objectives are: mechanisms of the strengthening (instability) mode of semiconductor components of semiconductor devices under conditions of impulse electromagnetic radiation in the presence of a potential barrier on the boundary of the media of the media. The methods used are the method of theory of small disturbances, which allows you to determine the spectrum of the own vibrations of the system: the current fluctuations of the semiconductor device in electromagnetic radiation. The following results are obtained: The interaction of surface plasmons with the flow was considered charged particles in the presence of a potential barrier based on energy principle. Kinetic equations have been obtained that determine the change in the number superficial plasmons, expressions for the increments of their instability with taking into account the size of a potential barrier on the border, which leads to the appearance of a beam reflected from the border. The results of the work allow you to take into account the contribution of the reflected and completed component of the energy flow energy into the total energy of the radiation of surface vibrations. The mechanisms of interaction between the flow of charged particles with the own electromagnetic fluctuations of two -dimensional electronic gas, the occurrence of which is due to the presence of a potential barrier on the border of the media section. Conclusion. Determination of the amplification (generation) modes of electro -radio products that distort their volt are ampere characteristics (reversible failures) depending on the parameters of external electromagnetic radiation. An analysis of the routes obtained in the work can be used in the development of radio emergency for working in a millimeter and submilimeter range (amplifiers, generators and frequency converters). Assessment of indicators of the exponential growth of amplitudes of the own fluctuations of semiconductor components (increement of instability as a criterion of reversible failures) show that the magnitude of the energy of radiation lies within the sensitivity of modern receivers of the radiation of the submilimeter range and is the reason for the failure.
势垒对电磁辐射条件下无线电产品自身波动激发机制的影响
本课题的主要内容是分析在半导体复杂的电子无线电装置(通信设备)中出现自身波动的过程和机制,如果有电流和电压委托与脉冲电磁辐射,其结果在工作中获得了半导体边界上的势垒、半导体边界上的半导体结构(电压安安)的特性。其目的是将外部电磁辐射引起的带电粒子流的能量转化为其自身在半导体结构中波动的能量的模型,同时考虑到结构本身的性质(边界处电位的异质性)。该模型的实现是由于运动电荷的过渡辐射的影响,当粒子流穿过具有各种电磁特性(介电渗透率)的介质截面边界时,其部分能量转化为自身在半导体结构中波动的能量。目标是:在脉冲电磁辐射条件下,在介质的介质边界上存在势垒的情况下,半导体器件的半导体元件的加强(不稳定)模式的机制。使用的方法是小扰动理论方法,它允许您确定系统自身振动的频谱:半导体器件在电磁辐射中的电流波动。根据能量原理,考虑了在势垒存在下表面等离子体与流体的相互作用。得到了决定表面等离子体数量变化的动力学方程,以及考虑边界上势垒大小的不稳定性增量的表达式,这导致了从边界反射光束的出现。功的结果使你能够考虑到流能量的反射和完成分量对表面振动辐射总能量的贡献。带电粒子的流动与二维电子气体自身的电磁波动之间的相互作用机制,其发生是由于在介质截面的边界上存在势垒。结论。根据外部电磁辐射的参数,确定扭曲其伏安特性(可逆失效)的无线电产品的放大(产生)模式。在工作中获得的线路分析可用于开发在毫米和亚毫米范围内工作的无线电应急(放大器、发电机和变频器)。对半导体元件自身波动幅度的指数增长指标的评估(作为可逆失效标准的不稳定性增加)表明,辐射能量的大小在现代接收器对亚毫米范围辐射的灵敏度范围内,这是失效的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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CiteScore
0.50
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发文量
47
审稿时长
5 weeks
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