Combined class of distributions with an exponentiated Weibull family for reliability application

Abstract

ABSTRACT We develop a novel class of distributions after the exponentiated Weibull family and vtub-shaped failure rate for systems are considered and compounded together. This combined class of distributions can be applied to reliability applications using the data, and we investigate its properties. We study the mathematical properties of combined distributions including order statistics and estimation by maximum likelihood. In addition, we implement an EM algorithm to determine unknown parameters using maximum likelihood estimates, and maximum entropy characterizations are discussed under appropriate constraints. Using maximum likelihood estimation, we obtain point estimates and interval estimation for parameters. We develop a novel approach to measuring the reliability of multi-component systems as well as a single-component system and illustrate the usefulness of the proposed approach. We apply the approach to real data sets and discuss numeric examples to show the statistical properties of the new compounding class of distributions derived in the paper.