A Low-cost Fault Tolerance Method for ARM and RISC-V Microprocessor-based Systems using Temporal Redundancy and Approximate Computing through Simplified Iterations

Q4 Engineering
Alexander Aponte-Moreno, Felipe Restrepo-Calle, C. Pedraza
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引用次数: 0

Abstract

Approximate Computing techniques have been successfully used to reduce the overhead associated with redundancy in fault-tolerant system designs. This paper presents a fault tolerance method to reduce the execution time overhead of the well-known Time Redundancy technique by means of an improvement proposed for the Approximate Computing software-based technique known as loop perforation. Time Redundancy is a software-based fault tolerance technique that involves executing replicas of a task at different times. We propose to approximate the tasks to be executed using a new approximate computing technique based on loop perforation, i.e., simplified iterations. The novelty of this method is the combined use of the fault tolerance technique, temporal redundancy, jointly with the new proposed Approximate Computing technique, simplified iterations. The proposal is validated through simulation-based fault injection campaigns on several test programs for the ARM and RISC-V microprocessor architectures. Experimental results verified not only the applicability of the proposal in different architectures, but also its effectiveness, showing a good trade-off between reliability, error and overhead. Results showed that using the proposed method, a normalized mean work to failure (MWTF) up to 5.28× was obtained with approximation errors lower than those obtained using the traditional loop perforation technique.
基于时间冗余和简化迭代近似计算的ARM和RISC-V微处理器系统低成本容错方法
在容错系统设计中,近似计算技术已被成功地用于减少冗余相关的开销。本文提出了一种容错方法,通过对基于近似计算软件的循环穿孔技术的改进,来减少众所周知的时间冗余技术的执行时间开销。时间冗余是一种基于软件的容错技术,它涉及在不同时间执行任务的副本。我们建议使用一种新的基于循环穿孔的近似计算技术来近似要执行的任务,即简化迭代。该方法的新颖之处在于将容错技术、时间冗余技术与新提出的近似计算技术相结合,简化了迭代。在ARM和RISC-V微处理器架构的几个测试程序上,通过基于仿真的故障注入活动验证了该建议。实验结果不仅验证了该方法在不同体系结构中的适用性,而且验证了其有效性,在可靠性、误差和开销之间取得了良好的平衡。结果表明,采用该方法可获得5.28倍的归一化平均失效功(MWTF),且近似误差低于传统环射孔技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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