Effect of Amorphous Carbon Coating on the Performance of Liquid Phase Transmission Electron Microscopy (LP-TEM) and the Dynamics of Enclosed Pt Nano-Colloids.

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Microscopy Pub Date : 2022-03-11 DOI:10.1093/jmicro/dfac012
Xiaoguang Li, K. Mitsuishi, M. Takeguchi
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引用次数: 1

Abstract

Ultra-thin silicon nitride (SiN) membranes are critical in microfabrication-based liquid cells (LCs) for transmission electron microscopy. This study used a homemade LC with a 50-nm SiN membrane to study the dynamics of 2.58-nm platinum (Pt) nanoparticles (NPs) in approximately 200-nm deep water. When a strong beam with electron flux ranging from 2.5 × 103 to 1.4 ×106 e-/(nm2·s) was applied to resolve the NPs, the beam caused NP aggregation and even drilled a hole on the top membrane. The hole drilling was prevented by coating a 1-4-nm-thick amorphous carbon layer on both sides of the membrane. The NP aggregation rate also decreased with increasing carbon thickness. After overcoming the aforementioned issues, lattice fringes of the Pt NPs were visible when the NPs were attached to the membrane of the 4-nm-carbon-coated LC containing a thin liquid layer. The effects of the electron beam and carbon on the LC and Pt NPs were investigated and discussed. This work provides a reference for LC-TEM research using strong electron beams.
非晶态碳涂层对液相透射电子显微镜(LP-TEM)性能和封闭Pt纳米胶体动力学的影响。
超薄氮化硅(SiN)膜是用于透射电子显微镜的基于微结构的液体电池(lc)的关键。本研究采用自制的LC和50 nm的SiN膜,研究了2.58 nm铂纳米粒子(NPs)在约200 nm深水中的动力学。当施加电子通量为2.5 × 103 ~ 1.4 ×106 e-/(nm2·s)的强光束来分解NPs时,会导致NP聚集,甚至在顶部膜上钻出孔。通过在膜的两侧涂覆1-4 nm厚的非晶碳层,防止了孔的钻出。NP聚集率也随碳厚度的增加而降低。克服上述问题后,当纳米粒子附着在含有薄液体层的4纳米碳包覆LC膜上时,可以看到Pt纳米粒子的晶格条纹。研究并讨论了电子束和碳对LC和Pt纳米粒子的影响。本工作为强电子束LC-TEM研究提供了参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microscopy
Microscopy Physics and Astronomy-Instrumentation
CiteScore
3.30
自引率
11.10%
发文量
76
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
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