Mean Differential Continuous Pulse Method for Accurate Optical Measurements of Light-Emitting Diodes and Laser Diodes.

IF 1.3 4区工程技术 Q3 INSTRUMENTS & INSTRUMENTATION

Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-11-23 eCollection Date: 2021-01-01 DOI:10.6028/jres.126.034

Yuqin Zong, Jeff Hulett, Naomasa Koide, Yoshiki Yamaji, C Cameron Miller

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Abstract

Limited sources exist for the application of germicidal ultraviolet (GUV) radiation. Ultraviolet light-emitting diodes (UV-LEDs) have significantly improved in efficiency and are becoming another viable source for GUV. We have developed a mean differential continuous pulse method (M-DCP method) for optical measurements of light-emitting diodes (LEDs) and laser diodes (LDs). The new M-DCP method provides an improvement on measurement uncertainty by one order of magnitude compared to the unpublished differential continuous pulse method (DCP method). The DCP method was already a significant improvement of the continuous pulse method (CP method) commonly used in the LED industry. The new M-DCP method also makes it possible to measure UV-LEDs with high accuracy. Here, we present the DCP method, discuss the potential systematic error sources in it, and present the M-DCP method along with its reduced systematic errors. This paper also presents the results of validation measurement of LEDs using the M-DCP method and common test instruments.

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精确测量发光二极管和激光二极管光学特性的平均微分连续脉冲法

杀菌紫外线（GUV）辐射的应用来源有限。紫外线发光二极管（UV LED）的效率显著提高，并正在成为GUV的另一个可行来源。我们开发了一种用于发光二极管（LED）和激光二极管（LD）光学测量的平均微分连续脉冲法（M-DCP法）。与未发表的微分连续脉冲法（DCP法）相比，新的M-DCP法将测量不确定度提高了一个数量级。DCP方法已经是LED工业中常用的连续脉冲方法（CP方法）的显著改进。新的M-DCP方法还可以高精度地测量紫外线LED。在这里，我们提出了DCP方法，讨论了其中潜在的系统误差源，并提出了M-DCP方法及其减少的系统误差。本文还介绍了使用M-DCP方法和常用测试仪器对LED进行验证测量的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Research of the National Institute of Standards and Technology 工程技术-物理：应用

自引率

33.30%

发文量

审稿时长

>12 weeks

期刊介绍： The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.