{"title":"Wide-spectrum optical synthetic aperture imaging via spatial intensity interferometry","authors":"Chunyan Chu, Zhentao Liu, Mingliang Chen, Xuehui Shao, Yuejin Zhao, Shensheng Han","doi":"10.29026/oea.2023.230017","DOIUrl":null,"url":null,"abstract":"High resolution imaging is achieved using increasingly larger apertures and successively shorter wavelengths. Optical aperture synthesis is an important high-resolution imaging technology used in astronomy. Conventional long baseline amplitude interferometry is susceptible to uncontrollable phase fluctuations, and the technical difficulty increases rapidly as the wavelength decreases. The intensity interferometry inspired by HBT experiment is essentially insensitive to phase fluctuations, but suffers from a narrow spectral bandwidth which results in a lack of detection sensitivity. In this study, we propose optical synthetic aperture imaging based on spatial intensity interferometry. This not only realizes diffraction-limited optical aperture synthesis in a single shot, but also enables imaging with a wide spectral bandwidth. And this method is insensitive to the optical path difference between the sub-apertures. Simulations and experiments present optical aperture synthesis diffraction-limited imaging through spatial intensity interferometry in a 100 $nm$ spectral width of visible light, whose maximum optical path difference between the sub-apertures reach $69.36\\lambda$. This technique is expected to provide a solution for optical aperture synthesis over kilometer-long baselines at optical wavelengths.","PeriodicalId":19611,"journal":{"name":"Opto-Electronic Advances","volume":"1 1","pages":""},"PeriodicalIF":15.3000,"publicationDate":"2022-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Opto-Electronic Advances","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.29026/oea.2023.230017","RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
High resolution imaging is achieved using increasingly larger apertures and successively shorter wavelengths. Optical aperture synthesis is an important high-resolution imaging technology used in astronomy. Conventional long baseline amplitude interferometry is susceptible to uncontrollable phase fluctuations, and the technical difficulty increases rapidly as the wavelength decreases. The intensity interferometry inspired by HBT experiment is essentially insensitive to phase fluctuations, but suffers from a narrow spectral bandwidth which results in a lack of detection sensitivity. In this study, we propose optical synthetic aperture imaging based on spatial intensity interferometry. This not only realizes diffraction-limited optical aperture synthesis in a single shot, but also enables imaging with a wide spectral bandwidth. And this method is insensitive to the optical path difference between the sub-apertures. Simulations and experiments present optical aperture synthesis diffraction-limited imaging through spatial intensity interferometry in a 100 $nm$ spectral width of visible light, whose maximum optical path difference between the sub-apertures reach $69.36\lambda$. This technique is expected to provide a solution for optical aperture synthesis over kilometer-long baselines at optical wavelengths.
期刊介绍:
Opto-Electronic Advances (OEA) is a distinguished scientific journal that has made significant strides since its inception in March 2018. Here's a collated summary of its key features and accomplishments:
Impact Factor and Ranking: OEA boasts an impressive Impact Factor of 14.1, which positions it within the Q1 quartiles of the Optics category. This high ranking indicates that the journal is among the top 25% of its field in terms of citation impact.
Open Access and Peer Review: As an open access journal, OEA ensures that research findings are freely available to the global scientific community, promoting wider dissemination and collaboration. It upholds rigorous academic standards through a peer review process, ensuring the quality and integrity of the published research.
Database Indexing: OEA's content is indexed in several prestigious databases, including the Science Citation Index (SCI), Engineering Index (EI), Scopus, Chemical Abstracts (CA), and the Index to Chinese Periodical Articles (ICI). This broad indexing facilitates easy access to the journal's articles by researchers worldwide.
Scope and Purpose: OEA is committed to serving as a platform for the exchange of knowledge through the publication of high-quality empirical and theoretical research papers. It covers a wide range of topics within the broad area of optics, photonics, and optoelectronics, catering to researchers, academicians, professionals, practitioners, and students alike.