{"title":"Cap layer effect in DC and RF characteristics of InP based n-p-n metamorphic δ-doped heterojunction bipolar transistor","authors":"M. Jena, A. Diwarkar, A. Panda, G. Dash","doi":"10.1080/21681724.2021.1941280","DOIUrl":null,"url":null,"abstract":"ABSTRACT The effect of InGaAsP and InGaAs cap layers in InP n-p-n heterojunction bipolar transistor (HBT) is presented. The common figures of merit (FOM) in each case are compared to assess their potentials for operation at high frequency. The Gummel-Poon plot of experimental reported result has been used to validate the data obtained from simulation using ATLAS module of Silvaco software tool. After models validation in TCAD tool, the DC and RF characteristics of the HBTs with different cap layers are examined and then a comparative analysis is carried out based on the characteristics such as I–V behaviour, frequency response, minimum noise figure and maximum cut-off frequency. With the change in InGaAs cap to InGaAsP cap, the DC current gain increases from 255 to 300, VCE,offset is reduced from 131 to 76 mV, Early Voltage (VA) increases from −42 to −190 V, cut-off frequency ft is increased from 24.34 MHz to 8.04 GHz, and the maximum oscillation of frequency(fmax) is improves from 13.79 to 37.11 GHz","PeriodicalId":13968,"journal":{"name":"International Journal of Electronics Letters","volume":"10 1","pages":"308 - 320"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/21681724.2021.1941280","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Electronics Letters","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/21681724.2021.1941280","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
ABSTRACT The effect of InGaAsP and InGaAs cap layers in InP n-p-n heterojunction bipolar transistor (HBT) is presented. The common figures of merit (FOM) in each case are compared to assess their potentials for operation at high frequency. The Gummel-Poon plot of experimental reported result has been used to validate the data obtained from simulation using ATLAS module of Silvaco software tool. After models validation in TCAD tool, the DC and RF characteristics of the HBTs with different cap layers are examined and then a comparative analysis is carried out based on the characteristics such as I–V behaviour, frequency response, minimum noise figure and maximum cut-off frequency. With the change in InGaAs cap to InGaAsP cap, the DC current gain increases from 255 to 300, VCE,offset is reduced from 131 to 76 mV, Early Voltage (VA) increases from −42 to −190 V, cut-off frequency ft is increased from 24.34 MHz to 8.04 GHz, and the maximum oscillation of frequency(fmax) is improves from 13.79 to 37.11 GHz
期刊介绍:
International Journal of Electronics Letters (IJEL) is a world-leading journal dedicated to the rapid dissemination of new concepts and developments across the broad and interdisciplinary field of electronics. The Journal welcomes submissions on all topics in electronics, with specific emphasis on the following areas: • power electronics • embedded systems • semiconductor devices • analogue circuits • digital electronics • microwave and millimetre-wave techniques • wireless and optical communications • sensors • instrumentation • medical electronics Papers should focus on technical applications and developing research at the cutting edge of the discipline. Proposals for special issues are encouraged, and should be discussed with the Editor-in-Chief.