{"title":"Prediction of Hit/Miss under Different Detection Conditions through Eddy Current Pulsed Thermography","authors":"孙 吉伟, 邓 栋栋, 李 泓江","doi":"10.3724/sp.j.7102614864","DOIUrl":null,"url":null,"abstract":": Eddy current pulsed thermography is an emerging nondestructive testing technique that has been widely used for flaw detection in metallic materials. Typically, its performance is evaluated through hit/miss analysis. However, the traditional method of analyzing hit/miss requires considerable experimental data, which is time-consuming and expensive. In this study, a model-assisted method based on back-propagation neural networks (BPNNs) for hit/miss prediction was developed to minimize the need for additional experimental tests. Thirty sets of metal specimens with fatigue cracks of different lengths were fabricated; 15 experimental groups were subjected to different detection conditions. Subsequently, three sets of the probability of detection (POD) curves were plotted, and the effects of the different detection conditions on the POD were analyzed. Finally, a prediction model of the hit/miss based on the BPNN was constructed, and the hit/miss prediction was realized. The results showed that under different detection conditions, the proposed framework could complete the hit/miss prediction with an error of zero.","PeriodicalId":64126,"journal":{"name":"红外技术","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"红外技术","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.3724/sp.j.7102614864","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
: Eddy current pulsed thermography is an emerging nondestructive testing technique that has been widely used for flaw detection in metallic materials. Typically, its performance is evaluated through hit/miss analysis. However, the traditional method of analyzing hit/miss requires considerable experimental data, which is time-consuming and expensive. In this study, a model-assisted method based on back-propagation neural networks (BPNNs) for hit/miss prediction was developed to minimize the need for additional experimental tests. Thirty sets of metal specimens with fatigue cracks of different lengths were fabricated; 15 experimental groups were subjected to different detection conditions. Subsequently, three sets of the probability of detection (POD) curves were plotted, and the effects of the different detection conditions on the POD were analyzed. Finally, a prediction model of the hit/miss based on the BPNN was constructed, and the hit/miss prediction was realized. The results showed that under different detection conditions, the proposed framework could complete the hit/miss prediction with an error of zero.
期刊介绍:
Infrared technology is one of the earliest photoelectronic journals in China.Infrared Technology is published by Science Press, and it is a single monthly technical journal.
Infrared Technology is a professional and academic journal based on scientific research, which comprehensively reflects the research progress of infrared technology at home and abroad and its application in national defense, industry, agriculture and national economy.After years of efforts, INFRARED Technology has become the core journal of Chinese, The core journal of Chinese science and technology, and the source journal of Chinese Science citation database.