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A SEMI-AUTOMATIC EXAMINATION OF CO2 STRUCTURES IN THIN FILMS AT LOW TEMPERATURES

IF 0.2 Q4 MATHEMATICS
International Journal of Mathematics and Physics Pub Date : 2023-06-01 DOI:10.26577/ijmph.2023.v14.i1.06
O. Golikov, D. Yerezhep, Timur Yerlanov
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低温下薄膜中CO2结构的半自动检测
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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来源期刊
International Journal of Mathematics and Physics
International Journal of Mathematics and Physics Multiple-
CiteScore
0.30
自引率
0.00%
发文量
11
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