Encounter Metrics and Exposure Notifcation.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
René Peralta, Angela Robinson
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引用次数: 0

Abstract

We discuss the measurement of aggregate levels of encounters in a population, a concept we call encounter metrics. Encounter metrics are designed so that they can be deployed while preserving the privacy of individuals. To this end, encounters are labeled with a random number that cannot be linked to anything that is broadcast at the time of the encounter. Among the applications of encounter metrics is privacy-preserving exposure notifcation, a system that allows people to obtain a measure of their risk due to past encounters with people who have self-reported to be positive with severe acute respiratory syndrome coronavirus 2 (SARS-CoV-19), the cause of coronavirus disease 2019 (COVID-19). The precise engineering of a system for exposure notifcation should be targeted to particular environments. We outline a system for use in the context of a workplace such as the National Institute of Standards and Technology (NIST).

接触指标和接触通知
我们讨论了一个群体中相遇的总体水平的测量,我们称之为相遇指标的概念相遇指标的设计是为了在保护个人隐私的同时进行部署。为此,相遇被标记为一个随机数,这个随机数不能与在相遇时广播的任何内容相关联。这是一个系统,可以让人们通过过去与自我报告为严重急性呼吸系统综合征冠状病毒2 (SARS-CoV-19)阳性的人的接触来衡量自己的风险,暴露通知系统的精确工程应针对特定环境。我们概述了在国家标准与技术研究院(NIST)等工作场所背景下使用的系统©2021国家标准与技术研究院保留所有权利
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来源期刊
自引率
33.30%
发文量
10
审稿时长
>12 weeks
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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