L. N. Melita, Silvia Rita Amato, V. Risdonne, Laura Ledwina, Austin Nevin, L. Burgio
{"title":"Francis Williams: Shedding light on the production, materials and techniques of the portrait of a Jamaican scholar","authors":"L. N. Melita, Silvia Rita Amato, V. Risdonne, Laura Ledwina, Austin Nevin, L. Burgio","doi":"10.1002/xrs.3385","DOIUrl":null,"url":null,"abstract":"The Victoria and Albert Museum holds an important portrait of the Jamaican scholar and writer Francis Williams (c.1692/97–1762), portrayed as a scholar in his study. It is believed to have been painted around 1745 by an unknown artist, but the circumstances of its production are unknown. A technical examination of the painting was performed using x‐radiography and infrared reflectography (IRR), macro x‐ray fluorescence scanning (XRF), digital microscopy, scanning electron microscopy with energy‐dispersive x‐ray spectroscopy (SEM–EDX) and reflectance imaging spectroscopy in the short‐wave infrared (SWIR). XRF, IRR and reflectance imaging spectroscopy in the SWIR revealed the distribution of inorganic pigments including lead white, earth pigments, Prussian blue, vermilion, orpiment (or pararealgar) and bone or ivory black. Pentimenti and a different sketched landscape were observed in the IRR images, highlighting changes in the final composition. Three‐dimensional (3D) digital microphotography provided additional historical and contextual information through the observation of book titles and details. High‐resolution digital imaging complemented analytical data. Results of the technical examination revealed the material composition and the development of the painting, contributing to shed new light on the production of the portrait, the history and significance of the portrait.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.5000,"publicationDate":"2023-08-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"X-Ray Spectrometry","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1002/xrs.3385","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
引用次数: 0
Abstract
The Victoria and Albert Museum holds an important portrait of the Jamaican scholar and writer Francis Williams (c.1692/97–1762), portrayed as a scholar in his study. It is believed to have been painted around 1745 by an unknown artist, but the circumstances of its production are unknown. A technical examination of the painting was performed using x‐radiography and infrared reflectography (IRR), macro x‐ray fluorescence scanning (XRF), digital microscopy, scanning electron microscopy with energy‐dispersive x‐ray spectroscopy (SEM–EDX) and reflectance imaging spectroscopy in the short‐wave infrared (SWIR). XRF, IRR and reflectance imaging spectroscopy in the SWIR revealed the distribution of inorganic pigments including lead white, earth pigments, Prussian blue, vermilion, orpiment (or pararealgar) and bone or ivory black. Pentimenti and a different sketched landscape were observed in the IRR images, highlighting changes in the final composition. Three‐dimensional (3D) digital microphotography provided additional historical and contextual information through the observation of book titles and details. High‐resolution digital imaging complemented analytical data. Results of the technical examination revealed the material composition and the development of the painting, contributing to shed new light on the production of the portrait, the history and significance of the portrait.
期刊介绍:
X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.
Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.
Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.