J. G. Barker, J. Cook, J. P. Chabot, S. Kline, Zhenhuan Zhang, C. Gagnon
{"title":"Extraneous Scattering Background in SANS Instruments","authors":"J. G. Barker, J. Cook, J. P. Chabot, S. Kline, Zhenhuan Zhang, C. Gagnon","doi":"10.1080/10448632.2022.2035571","DOIUrl":null,"url":null,"abstract":"Three often overlooked sources of extraneous background scattering from surfaces in small angle neutron scattering (SANS) instruments have been examined in detail. Figure 1 shows schematically these sources: (i) the red ray shows a path from scattering of the direct beam off the beam stop which then scatters off the vessel lining and onto the detector; (ii) the blue ray shows a path from scattering from the sample onto the vessel lining and onto the detector; and (iii) the green ray shows a path from scattering from the sample onto the surrounding sample environment and onto the detector. The paper Barker et al. [1] describes scattering measurements, calculations and de-sign ideas to mitigate all three sources of background. affects accuracy of The from the rescatter from en-hance the empty The sample air from sample enhanced. The enhanced detector vessel 4% by nine position a further 16% the cross-section upon the sample-to-detector instruments using the at the NCNR, D33 at the and","PeriodicalId":39014,"journal":{"name":"Neutron News","volume":" ","pages":"4 - 5"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Neutron News","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/10448632.2022.2035571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}
引用次数: 0
Abstract
Three often overlooked sources of extraneous background scattering from surfaces in small angle neutron scattering (SANS) instruments have been examined in detail. Figure 1 shows schematically these sources: (i) the red ray shows a path from scattering of the direct beam off the beam stop which then scatters off the vessel lining and onto the detector; (ii) the blue ray shows a path from scattering from the sample onto the vessel lining and onto the detector; and (iii) the green ray shows a path from scattering from the sample onto the surrounding sample environment and onto the detector. The paper Barker et al. [1] describes scattering measurements, calculations and de-sign ideas to mitigate all three sources of background. affects accuracy of The from the rescatter from en-hance the empty The sample air from sample enhanced. The enhanced detector vessel 4% by nine position a further 16% the cross-section upon the sample-to-detector instruments using the at the NCNR, D33 at the and
本文详细研究了小角中子散射(SANS)仪器中来自表面的三种经常被忽视的外来背景散射源。图1显示了这些光源的示意图:(i)红色射线显示了直接光束从光束停止处散射的路径,然后从容器衬里散射到探测器上;(ii)蓝光显示了从样品散射到容器衬里和探测器的路径;(iii)绿色射线显示了从样品散射到周围样品环境并到达检测器的路径。论文Barker et al.[1]描述了散射测量、计算和设计思想,以减轻这三种背景源。影响精度,从散射增强从空样品空气从样品增强。增强型探测船使用NCNR, D33和NCNR,在样品到探测器仪器的横截面上又增加了16%