On the radiative and multiple reflection corrections of the van der Waals force between two particles/atoms: dipolar contribution

IF 1.2 4区 物理与天体物理 Q3 PHYSICS, MULTIDISCIPLINARY
J. R. Zurita-Sánchez
{"title":"On the radiative and multiple reflection corrections of the van der Waals force between two particles/atoms: dipolar contribution","authors":"J. R. Zurita-Sánchez","doi":"10.31349/revmexfis.69.040403","DOIUrl":null,"url":null,"abstract":"We present a theoretical formalism based on fluctuational electrodynamics and the Maxwell-stress tensor for describing the impact of radiative and multiple reflections corrections on the van der Waals force between two nanoscale spherical particles and a pair of atoms in the dipolar approximation. Particularly, we examine the van der Waals forces for two metallic particles whose dielectric constant is represented by the Drude model, for two dielectric particles in which their material response has phononic resonances, and for two atoms with dynamic polarizabilities containing a single resonant frequency. For the metallic particles, in relation to the case in which the aforementioned effects are omitted, the van der Waals force is unchanged by the radiative corrections of the polarizabilities, whereas the mechanism of multiple reflections perturbs force about a few percentage points when the spheres nearly touch each other. In contrast to the the metallic case, the radiative corrections of the polarizabilities of the dielectric particles modify peculiarly the van der Waals force in comparison to the case where such corrections are neglected; there is a critical interparticle separation that divides two regimes: when the interparticle separation is smaller (larger) than this critical distance the force with radiative corrections is smaller (greater) than that without these corrections. Moreover, the van der Waals force is practically unchanged when effect of multiple reflections is taken into account. For the atomic case, the deviation of the van der Waals force due to multiple reflections is about a few percentage points when the interatomic separation corresponds to twice the van der Waals radius, and this deviation can reach about seventeen percent at a separation of 2.5 times the atomic radius. This work might have implications concerning the fine-tuning between theoretical and experimental outcomes of the van der Waals forces.","PeriodicalId":21538,"journal":{"name":"Revista Mexicana De Fisica","volume":null,"pages":null},"PeriodicalIF":1.2000,"publicationDate":"2023-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Revista Mexicana De Fisica","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.31349/revmexfis.69.040403","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

We present a theoretical formalism based on fluctuational electrodynamics and the Maxwell-stress tensor for describing the impact of radiative and multiple reflections corrections on the van der Waals force between two nanoscale spherical particles and a pair of atoms in the dipolar approximation. Particularly, we examine the van der Waals forces for two metallic particles whose dielectric constant is represented by the Drude model, for two dielectric particles in which their material response has phononic resonances, and for two atoms with dynamic polarizabilities containing a single resonant frequency. For the metallic particles, in relation to the case in which the aforementioned effects are omitted, the van der Waals force is unchanged by the radiative corrections of the polarizabilities, whereas the mechanism of multiple reflections perturbs force about a few percentage points when the spheres nearly touch each other. In contrast to the the metallic case, the radiative corrections of the polarizabilities of the dielectric particles modify peculiarly the van der Waals force in comparison to the case where such corrections are neglected; there is a critical interparticle separation that divides two regimes: when the interparticle separation is smaller (larger) than this critical distance the force with radiative corrections is smaller (greater) than that without these corrections. Moreover, the van der Waals force is practically unchanged when effect of multiple reflections is taken into account. For the atomic case, the deviation of the van der Waals force due to multiple reflections is about a few percentage points when the interatomic separation corresponds to twice the van der Waals radius, and this deviation can reach about seventeen percent at a separation of 2.5 times the atomic radius. This work might have implications concerning the fine-tuning between theoretical and experimental outcomes of the van der Waals forces.
两个粒子/原子之间范德华力的辐射和多重反射修正:偶极贡献
我们提出了一种基于波动电动力学和麦克斯韦应力张量的理论形式,用于描述在偶极近似下两个纳米级球形粒子和一对原子之间的辐射和多重反射修正对范德华力的影响。特别是,我们研究了两个金属粒子的范德华力,其介电常数由德鲁德模型表示,两个介电粒子的材料响应具有声子共振,以及两个原子的动态极化率包含一个单一的共振频率。对于金属粒子,在忽略上述效应的情况下,范德华力不受极化率的辐射修正的影响,而当球体几乎相互接触时,多重反射机制使力产生几个百分点的扰动。与金属情况相反,与忽略这种修正的情况相比,介电粒子极化率的辐射修正特别地改变了范德华力;有一个临界质点间的分离,它划分了两种状态:当质点间的分离小于(大于)这个临界距离时,有辐射修正的力比没有这些修正的力小(大于)。此外,考虑多次反射效应时,范德华力几乎没有变化。在原子的情况下,当原子间距离为两倍的范德华半径时,由于多次反射引起的范德华力偏差约为几个百分点,而在原子间距离为2.5倍的原子半径时,这种偏差可达到约17%。这项工作可能对范德华力的理论和实验结果之间的微调有影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Revista Mexicana De Fisica
Revista Mexicana De Fisica 物理-物理:综合
CiteScore
2.20
自引率
11.80%
发文量
87
审稿时长
4-8 weeks
期刊介绍: Durante los últimos años, los responsables de la Revista Mexicana de Física, la Revista Mexicana de Física E y la Revista Mexicana de Física S, hemos realizado esfuerzos para fortalecer la presencia de estas publicaciones en nuestra página Web ( http://rmf.smf.mx).
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信