{"title":"A numerical-analytical approach to determining the real contact area of rough surface contact","authors":"Can Wang, D. Schipper","doi":"10.1080/17515831.2020.1720382","DOIUrl":null,"url":null,"abstract":"ABSTRACT The objective of this study is to improve the accuracy of the real contact area calculated by the semi-analytical method (SAM). Two types of surface pairs are investigated: an analytically generated sinusoidal wavy surface against a rigid flat, and a pair of real rough surfaces. The results suggest that the real contact area calculated by the SAM is extremely sensitive to the resolution of input, i.e. the grid size. The SAM results of the real contact areas show poor convergence, especially in the case of the real rough surfaces. The main reason for this difference is the ‘over-covering’ effect when SAM calculates the real contact area. An exponential extrapolation technique is proposed to predict the real contact area values when further refinement of the grid resolution is unfeasible.","PeriodicalId":23331,"journal":{"name":"Tribology - Materials, Surfaces & Interfaces","volume":"14 1","pages":"166 - 176"},"PeriodicalIF":1.6000,"publicationDate":"2020-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/17515831.2020.1720382","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tribology - Materials, Surfaces & Interfaces","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/17515831.2020.1720382","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, COATINGS & FILMS","Score":null,"Total":0}
引用次数: 4
Abstract
ABSTRACT The objective of this study is to improve the accuracy of the real contact area calculated by the semi-analytical method (SAM). Two types of surface pairs are investigated: an analytically generated sinusoidal wavy surface against a rigid flat, and a pair of real rough surfaces. The results suggest that the real contact area calculated by the SAM is extremely sensitive to the resolution of input, i.e. the grid size. The SAM results of the real contact areas show poor convergence, especially in the case of the real rough surfaces. The main reason for this difference is the ‘over-covering’ effect when SAM calculates the real contact area. An exponential extrapolation technique is proposed to predict the real contact area values when further refinement of the grid resolution is unfeasible.