Preparation and Characterization of Pristine PMMA and PVDF Thin Film using Solution Casting Process for Optoelectronic Devices

Q4 Materials Science
C. Rameshkumar, S. Sarojini, K. Naresh, R. Subalakshmi
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引用次数: 34

Abstract

The PMMA and PVDF thin films were synthesized by solution casting process. The structural, spectroscopic, and morphological attributes of both the interface and surface of the film have been investigated. The structural properties of pristine PMMA and PVDF thin film were studied by XRD. The XRD spectra showed the detailed state of order and disorder of the system. From the XRD studies amorphous nature as well as the crystallanity (semi crystalline nature) of the polymer thin film were identified. SEM showed the surface morphology of the pristine PMMA and PVDF thin film. From the SEM image the size and the porous nature of the thin film were estimated. The UV showed the absorption characteristics of PMMA and PVDF thin films. From the UV-Visible spectra, we determined the direct and indirect optical energy gap of pristine PMMA and PVDF polymer samples by Devi's and Mott formula and Tauc's Expression. To the best of our knowledge, the direct and indirect energy gap in pristine PMMA and PVDF polymer thin films have been observed for the first time as no such report was found in literature survey.
光电器件用纯PMMA和PVDF薄膜的溶液铸造制备与表征
采用溶液浇铸法合成了PMMA和PVDF薄膜。研究了薄膜界面和表面的结构、光谱和形态特征。用XRD研究了原始PMMA和PVDF薄膜的结构性能。XRD光谱显示了系统的有序和无序的详细状态。通过XRD研究,确定了聚合物薄膜的非晶性质以及结晶性(半结晶性质)。SEM显示了原始PMMA和PVDF薄膜的表面形态。根据SEM图像估计了薄膜的尺寸和多孔性质。紫外光谱显示了PMMA和PVDF薄膜的吸收特性。根据紫外可见光谱,我们通过Devi和Mott公式以及Tauc表达式确定了原始PMMA和PVDF聚合物样品的直接和间接光学能隙。据我们所知,首次在原始PMMA和PVDF聚合物薄膜中观察到直接和间接能隙,因为在文献调查中没有发现这样的报道。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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期刊介绍: The Indian Society for Surface Science and Technology is an organization for the cultivation, interaction and dissemination of knowledge in the field of surface science and technology. It also strives to promote Industry-Academia interaction
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