Towards efficient application-dependent dimensional measurements with computed tomography: optimized reduction of measurement duration using continuous scan mode: experimental investigations

IF 0.8 Q4 INSTRUMENTS & INSTRUMENTATION

Journal of Sensors and Sensor Systems Pub Date : 2022-08-01 DOI:10.5194/jsss-11-219-2022

C. Orgeldinger, F. Wohlgemuth, A. Müller, T. Hausotte

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引用次数: 0

Abstract

Abstract. Due to the complex physical and technical relationships in dimensional X-ray computed tomography measurement technology, the precise influences on the measurement result are still not fully understood. A deeper understanding of these influences is essential in order to improve the measurement accuracy and economy of computed tomographic measurement systems. In addition, this enables better numerical determination of measurement uncertainties, which is also a topic of current research. Two factors that have a significant influence on the lead times are the scan mode and the number of projections per measurement. In this article, these factors are investigated experimentally using a calibrated workpiece, and the influence of the workpiece position on the measurement result is also examined. It can be shown that the workpiece position has a considerable influence on the quality of the measurement, especially in the case of a continuous scan. The results show a vast potential for application-dependent reduction of lead times.

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通过计算机断层扫描实现有效的应用相关尺寸测量:使用连续扫描模式优化减少测量持续时间:实验研究

摘要由于三维X射线计算机断层扫描测量技术中复杂的物理和技术关系，对测量结果的精确影响尚不完全清楚。为了提高计算机断层摄影测量系统的测量精度和经济性，深入了解这些影响是至关重要的。此外，这能够更好地确定测量不确定性的数值，这也是当前研究的主题。对提前期有重大影响的两个因素是扫描模式和每次测量的投影数。本文利用校准工件对这些因素进行了实验研究，并考察了工件位置对测量结果的影响。可以看出，工件位置对测量质量有很大影响，尤其是在连续扫描的情况下。研究结果表明，根据应用程序缩短交付周期具有巨大潜力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Sensors and Sensor Systems INSTRUMENTS & INSTRUMENTATION-

CiteScore

2.30

自引率

10.00%

发文量

审稿时长

23 weeks

期刊介绍： Journal of Sensors and Sensor Systems (JSSS) is an international open-access journal dedicated to science, application, and advancement of sensors and sensors as part of measurement systems. The emphasis is on sensor principles and phenomena, measuring systems, sensor technologies, and applications. The goal of JSSS is to provide a platform for scientists and professionals in academia – as well as for developers, engineers, and users – to discuss new developments and advancements in sensors and sensor systems.