Solar-Blind Ultraviolet Detection Based on Algan/GaN Heterojunction

IF 0.6 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Lechen Yang, Kai Fu, Min Xiong, Haijun Li, Wenhua Shi, Baoshun Zhang
{"title":"Solar-Blind Ultraviolet Detection Based on Algan/GaN Heterojunction","authors":"Lechen Yang, Kai Fu, Min Xiong, Haijun Li, Wenhua Shi, Baoshun Zhang","doi":"10.1166/jno.2023.3426","DOIUrl":null,"url":null,"abstract":"A solar-blind ultraviolet metal-semiconductor-metal photodetector based on dual-color AlGaN/GaN heterostructure was fabricated and tested. The device showed good photo-response in solar-blind ultraviolet, by employing a single AlGaN/GaN layer. Spectrum responses of the photodetector\n were investigated by changing the frequency of incident light signals and the bias voltages. The peak response was 0.288 A/W at 260 nm and 0.322 A/W at 366 nm at the bias of 5 V.","PeriodicalId":16446,"journal":{"name":"Journal of Nanoelectronics and Optoelectronics","volume":" ","pages":""},"PeriodicalIF":0.6000,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nanoelectronics and Optoelectronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1166/jno.2023.3426","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

A solar-blind ultraviolet metal-semiconductor-metal photodetector based on dual-color AlGaN/GaN heterostructure was fabricated and tested. The device showed good photo-response in solar-blind ultraviolet, by employing a single AlGaN/GaN layer. Spectrum responses of the photodetector were investigated by changing the frequency of incident light signals and the bias voltages. The peak response was 0.288 A/W at 260 nm and 0.322 A/W at 366 nm at the bias of 5 V.
基于Algan/GaN异质结的日盲紫外探测
制作并测试了一种基于双色AlGaN/GaN异质结构的太阳盲紫外金属-半导体-金属光电探测器。该器件采用单一的AlGaN/GaN层,在太阳盲紫外线下具有良好的光响应。通过改变入射光信号的频率和偏置电压,研究了光电探测器的光谱响应。在5v偏置下,260 nm处峰值响应为0.288 A/W, 366 nm处峰值响应为0.322 A/W。
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来源期刊
Journal of Nanoelectronics and Optoelectronics
Journal of Nanoelectronics and Optoelectronics 工程技术-工程:电子与电气
自引率
16.70%
发文量
48
审稿时长
12.5 months
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