Brendan Moran, Mark J. Holmes, J. Flemish, R. Armitage, Zhongmin Ren, Hossein Lotfi, Theodore Chung, Hee Jin Kim, Hisashi Masui, R. Pathak, Jia-Cheng Tan, Boon Hon Tan, Yongxiang Melvin Tio, Shimin Lim, Kheng Boo Lim, O. Shchekin
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引用次数: 0
Abstract
We present state of the art for microLED materials, devices, and
reliability. We show performance efficiencies as a function of
current density and device size for InGaN Red, Green, and Blue
and AlInGaP Red materials and breakdown EQE into constituent
IQE and extraction efficiency. We also present reliability results for
these structures across all materials systems. We then review
several concurrently developed technologies that serve to maximize
microLED performance in application use.
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