Model for Prediction of Testing Time of a Computer Program for Automated Reliability Evaluation of Semiconductor Devices

V. Kaziuchyts, S. Borovikov, E. Shneiderov
{"title":"Model for Prediction of Testing Time of a Computer Program for Automated Reliability Evaluation of Semiconductor Devices","authors":"V. Kaziuchyts, S. Borovikov, E. Shneiderov","doi":"10.35596/1729-7648-2022-20-7-72-80","DOIUrl":null,"url":null,"abstract":"The KLASS computer program planned for development is designed to work as a part of the ARION-plus software package and allows you to perform an automated assessment of the reliability of electronic products, including semiconductor devices. At the stage of work planning on the creation of the KLASS program, as a module of the ARION-plus complex, the question arose about the working time allotted for the procedure for testing a computer program. The approaches described in the scientific literature used to assess the operational reliability of computer programs, taking into account their testing, proceed from the fact that the program code has been written and debugged and there are certain data on the results of testing the computer program. Software developers would like to know the predicted testing time, which ensures a given operational reliability of a computer program, even before starting work on writing program code. Based on the analysis of the experimental data on the reliability of computer programs in various fields of application, a model is proposed for determining the testing time required to ensure the operational reliability of programs. The model was used for the computer program KLASS planned for development and takes into account the programming language, the amount of program code, the speed of the computer processor, and the scope of the program. Based on the obtained model, a nomogram with two binary fields was constructed, which allows one to quickly determine the predicted time for testing computer programs.","PeriodicalId":33565,"journal":{"name":"Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioelektroniki","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioelektroniki","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.35596/1729-7648-2022-20-7-72-80","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The KLASS computer program planned for development is designed to work as a part of the ARION-plus software package and allows you to perform an automated assessment of the reliability of electronic products, including semiconductor devices. At the stage of work planning on the creation of the KLASS program, as a module of the ARION-plus complex, the question arose about the working time allotted for the procedure for testing a computer program. The approaches described in the scientific literature used to assess the operational reliability of computer programs, taking into account their testing, proceed from the fact that the program code has been written and debugged and there are certain data on the results of testing the computer program. Software developers would like to know the predicted testing time, which ensures a given operational reliability of a computer program, even before starting work on writing program code. Based on the analysis of the experimental data on the reliability of computer programs in various fields of application, a model is proposed for determining the testing time required to ensure the operational reliability of programs. The model was used for the computer program KLASS planned for development and takes into account the programming language, the amount of program code, the speed of the computer processor, and the scope of the program. Based on the obtained model, a nomogram with two binary fields was constructed, which allows one to quickly determine the predicted time for testing computer programs.
半导体器件可靠性自动评估计算机程序测试时间的预测模型
计划开发的KLASS计算机程序被设计为orion -plus软件包的一部分,并允许您对包括半导体设备在内的电子产品的可靠性进行自动评估。在创建KLASS程序的工作规划阶段,作为orion -plus综合体的一个模块,出现了关于测试计算机程序的程序分配工作时间的问题。考虑到计算机程序的测试,科学文献中描述的用于评估计算机程序运行可靠性的方法,是从程序代码已经编写和调试以及计算机程序测试结果有一定数据这一事实出发的。软件开发人员甚至在开始编写程序代码之前,就想知道预测的测试时间,以确保计算机程序的给定操作可靠性。在分析各种应用领域计算机程序可靠性实验数据的基础上,提出了保证程序运行可靠性所需测试时间的确定模型。该模型用于KLASS计划开发的计算机程序,并考虑了编程语言、程序代码量、计算机处理器速度和程序范围。在此基础上,构造了具有两个二元域的态图,可以快速确定计算机程序测试的预测时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
87
审稿时长
8 weeks
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信