In‐house manufactured benchtop XRF spectrometer

IF 1.5 4区物理与天体物理 Q3 SPECTROSCOPY

X-Ray Spectrometry Pub Date : 2023-06-14 DOI:10.1002/xrs.3375

Jonatha Demetrio Gozetto, Eduardo de Almeida, M. A. Brasil, A. Virgilio, Eduardo Santos, G. R. Furlan, H. W. Pereira de Carvalho

引用次数: 1

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内部制造的台式XRF光谱仪

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

X-Ray Spectrometry 物理-光谱学

CiteScore

3.10

自引率

8.30%

发文量

审稿时长

6-12 weeks

期刊介绍： X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources. Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods. Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.