Infrared Thermography For Seal Defects Detection On Packaged Products: Unbalanced Machine Learning Classification With Iterative Digital Image Restoration
{"title":"Infrared Thermography For Seal Defects Detection On Packaged Products: Unbalanced Machine Learning Classification With Iterative Digital Image Restoration","authors":"Victor Guillot","doi":"10.5565/rev/elcvia.1567","DOIUrl":null,"url":null,"abstract":"Non-destructive and online defect detection on seals is increasingly being deployed in packaging processes, especially for food and pharmaceutical products. It is a key control step in these processes as it curtails the costs of these defects. \nTo address this cause, this paper highlights a combination of two cost-effective methods, namely machine learning algorithms and infrared thermography. Expectations can, however, be restricted when the training data is small, unbalanced, and subject to optical imperfections. \nThis paper proposes a classification method that tackles these limitations. Its accuracy exceeds 93% with two small training sets, including 2.5 to 10 times fewer negatives. Its algorithm has a low computational cost compared to deep learning approaches, and does not need any prior statistical studies on defects characterization.","PeriodicalId":38711,"journal":{"name":"Electronic Letters on Computer Vision and Image Analysis","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronic Letters on Computer Vision and Image Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5565/rev/elcvia.1567","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Computer Science","Score":null,"Total":0}
引用次数: 0
Abstract
Non-destructive and online defect detection on seals is increasingly being deployed in packaging processes, especially for food and pharmaceutical products. It is a key control step in these processes as it curtails the costs of these defects.
To address this cause, this paper highlights a combination of two cost-effective methods, namely machine learning algorithms and infrared thermography. Expectations can, however, be restricted when the training data is small, unbalanced, and subject to optical imperfections.
This paper proposes a classification method that tackles these limitations. Its accuracy exceeds 93% with two small training sets, including 2.5 to 10 times fewer negatives. Its algorithm has a low computational cost compared to deep learning approaches, and does not need any prior statistical studies on defects characterization.