MFIG — A Mass Filtered Ion Gauge

IF 0.5 Q4 NANOSCIENCE & NANOTECHNOLOGY

E-journal of Surface Science and Nanotechnology Pub Date : 2023-09-07 DOI:10.1380/ejssnt.2023-059

Herman Bekman, Jurjen Emmelkamp, Youyou Westland, Dorus Elstgeest, Thomas Mechielsen, Michael Haye, Freek Molkenboer, Norbert Koster, Henk Lensen

引用次数: 0

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MFIG——一种质量过滤离子计

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

E-journal of Surface Science and Nanotechnology NANOSCIENCE & NANOTECHNOLOGY-

CiteScore

1.10

自引率

14.30%

发文量

审稿时长

12 weeks

期刊介绍： Our completely electronic and open-access journal aims at quick and versatile-style publication of research papers on fundamental theory and experiments at frontiers of science and technology relating to surfaces, interfaces, thin films, fine particles, nanowires, nanotubes, and other nanometer-scale structures, and their interdisciplinary areas such as crystal growth, vacuum technology, and so on. It covers their physics, chemistry, biology, materials science, and their applications to advanced technology for computations, communications, memory, catalysis, sensors, biological and medical purposes, energy and environmental problems, and so on.