H. Yim, Jinho Lee, W. Kim, Seungje Oh, D. Seo, Donghee Lee, Ryun Na Kim, Woo-Byoung Kim
{"title":"Electrical Properties of TiN/TiO2/FTO Resistive Random-Access Memory Based on Peroxo Titanium Complex Sol Solution by Heat Treatment","authors":"H. Yim, Jinho Lee, W. Kim, Seungje Oh, D. Seo, Donghee Lee, Ryun Na Kim, Woo-Byoung Kim","doi":"10.3740/mrsk.2022.32.9.384","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":17864,"journal":{"name":"Korean Journal of Materials Research","volume":" ","pages":""},"PeriodicalIF":0.3000,"publicationDate":"2022-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Korean Journal of Materials Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3740/mrsk.2022.32.9.384","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}