Shan Wei, Yajun Pang, Zhen-xu Bai, Yulei Wang, Zhiwei Lu
{"title":"Research Progress of Stress Measurement Technologies for Optical Elements","authors":"Shan Wei, Yajun Pang, Zhen-xu Bai, Yulei Wang, Zhiwei Lu","doi":"10.1155/2021/5541358","DOIUrl":null,"url":null,"abstract":"It is of great significance to measure the residual stress distribution accurately for optical elements and evaluate its influence on the performance of optical instruments in optical imaging, aviation remote sensing, semiconductor manufacturing, and other fields. The stress of optical elements can be closely related to birefringence based on photoelasticity. Thus, the method of quantifying birefringence to obtain the stress becomes the main method of stress measurement technologies for optical elements. This paper first introduces the basic principle of stress measurement based on photoelasticity. Then, the research progress of stress measurement technologies based on this principle is reviewed, which can be classified into two methods: polarization method and interference method. Meanwhile, the advantages and disadvantages of various stress measurement technologies are analyzed and compared. Finally, the developing trend of stress measurement technologies for optical elements is summarized and prospected.","PeriodicalId":55995,"journal":{"name":"International Journal of Optics","volume":null,"pages":null},"PeriodicalIF":1.8000,"publicationDate":"2021-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Optics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1155/2021/5541358","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 1
Abstract
It is of great significance to measure the residual stress distribution accurately for optical elements and evaluate its influence on the performance of optical instruments in optical imaging, aviation remote sensing, semiconductor manufacturing, and other fields. The stress of optical elements can be closely related to birefringence based on photoelasticity. Thus, the method of quantifying birefringence to obtain the stress becomes the main method of stress measurement technologies for optical elements. This paper first introduces the basic principle of stress measurement based on photoelasticity. Then, the research progress of stress measurement technologies based on this principle is reviewed, which can be classified into two methods: polarization method and interference method. Meanwhile, the advantages and disadvantages of various stress measurement technologies are analyzed and compared. Finally, the developing trend of stress measurement technologies for optical elements is summarized and prospected.
期刊介绍:
International Journal of Optics publishes papers on the nature of light, its properties and behaviours, and its interaction with matter. The journal considers both fundamental and highly applied studies, especially those that promise technological solutions for the next generation of systems and devices. As well as original research, International Journal of Optics also publishes focused review articles that examine the state of the art, identify emerging trends, and suggest future directions for developing fields.