{"title":"X-ray nanochemistry concepts and development","authors":"J. Helliwell","doi":"10.1080/0889311X.2018.1526173","DOIUrl":null,"url":null,"abstract":"[1] Lytle FW. The EXAFS family tree: a personal history of the development of x-ray absorption fine structure. J Synchrotron Rad. 1999;6:123–134. [2] Binsted N, Pack MJ, Teller MT, Evans J. Combined EXAFS and powder diffraction analysis. J Am Chem Soc. 1996;118:11200–11210. [3] Chantler CT, Bunker BA, Abe H, Kimura M, Newville M, Welter E. A call for a round robin study of XAFS stability and platform dependence at synchrotron beamlines on well defined samples. J Synchrotron Rad. 2018;25(4):935–943. [4] Filipponi A, Di Cicco A. Atomic background in x-ray absorption spectra of fifth-period elements: evidence for double-electron excitation edges. Phys Rev A. 1995;52:1072–1078. [5] Jolliffe IT. Principal component analysis. New York: Springer-Verlag; 2002. [6] Parsons AD, Price SWT, Wadeson N, Basham M, Beale AM, Ashton AW, Mosselmans JFW, Quinn PD. Automatic processing of multimodal tomography datasets. J Synchrotron Radiat. 2017;24:248–256. [7] Rehr JJ, Albers RC. Theoretical approaches to x-ray absorption fine structure. Rev Mod Phys. 2000;72:621–654.","PeriodicalId":54385,"journal":{"name":"Crystallography Reviews","volume":"24 1","pages":"276 - 280"},"PeriodicalIF":2.0000,"publicationDate":"2018-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/0889311X.2018.1526173","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Crystallography Reviews","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1080/0889311X.2018.1526173","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CRYSTALLOGRAPHY","Score":null,"Total":0}
引用次数: 6
Abstract
[1] Lytle FW. The EXAFS family tree: a personal history of the development of x-ray absorption fine structure. J Synchrotron Rad. 1999;6:123–134. [2] Binsted N, Pack MJ, Teller MT, Evans J. Combined EXAFS and powder diffraction analysis. J Am Chem Soc. 1996;118:11200–11210. [3] Chantler CT, Bunker BA, Abe H, Kimura M, Newville M, Welter E. A call for a round robin study of XAFS stability and platform dependence at synchrotron beamlines on well defined samples. J Synchrotron Rad. 2018;25(4):935–943. [4] Filipponi A, Di Cicco A. Atomic background in x-ray absorption spectra of fifth-period elements: evidence for double-electron excitation edges. Phys Rev A. 1995;52:1072–1078. [5] Jolliffe IT. Principal component analysis. New York: Springer-Verlag; 2002. [6] Parsons AD, Price SWT, Wadeson N, Basham M, Beale AM, Ashton AW, Mosselmans JFW, Quinn PD. Automatic processing of multimodal tomography datasets. J Synchrotron Radiat. 2017;24:248–256. [7] Rehr JJ, Albers RC. Theoretical approaches to x-ray absorption fine structure. Rev Mod Phys. 2000;72:621–654.
期刊介绍:
Crystallography Reviews publishes English language reviews on topics in crystallography and crystal growth, covering all theoretical and applied aspects of biological, chemical, industrial, mineralogical and physical crystallography. The intended readership is the crystallographic community at large, as well as scientists working in related fields of interest. It is hoped that the articles will be accessible to all these, and not just specialists in each topic. Full reviews are typically 20 to 80 journal pages long with hundreds of references and the journal also welcomes shorter topical, book, historical, evaluation, biographical, data and key issues reviews.