A Quantity Chalcopyrite Reference Material For In Situ Sulfur Isotope Analysis

IF 3.4 2区化学 Q1 SPECTROSCOPY

Atomic Spectroscopy Pub Date : 2023-08-01 DOI:10.46770/as.2023.141

Youwei Chen

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引用次数: 0

Abstract

: Secondary ion mass spectrometry (SIMS) for sulfur isotope analysis in chalcopyrite is an essential technique with exceptional spatial resolution, which enables precise constraints on mineralization mechanisms. However, the scarcity of matrix-matched chalcopyrite reference materials (RM) for SIMS hinders its accuracy and reliability. This study introduces a large-grained natural chalcopyrite RM (IGSD) for precise sulfur isotope analysis (δ 34 S) using SIMS and laser ablation multicollector-inductively coupled plasma mass spectrometry (LA-MC-ICPMS). Petrographic examination and electron microprobe analysis (EMPA) results confirm the homogeneity of major elements in the IGSD chalcopyrite grains. The results of in situ analysis at four SIMS laboratories and one LA-MC-ICPMS laboratory and bulk analysis confirm the homogeneity of the S isotope composition in the IGSD chalcopyrite grains. The in situ analysis result is consistent with the result of isotope ratio mass spectroscopy (IRMS), which falls within the same range of uncertainty. This supports the suitability of the IGSD chalcopyrite RM for in situ S isotope analysis. The recommended δ 34 S value of the IGSD chalcopyrite RM, based on IRMS, is 4.21 ± 0.23‰ (2SD, n = 30).

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原位硫同位素分析的定量黄铜矿标准物质

：用于黄铜矿硫同位素分析的二次离子质谱（SIMS）是一项具有卓越空间分辨率的重要技术，能够精确约束矿化机制。然而，用于SIMS的基质匹配黄铜矿参考材料（RM）的稀缺性阻碍了其准确性和可靠性。本研究介绍了一种大颗粒天然黄铜矿RM（IGSD），用于使用SIMS和激光烧蚀多收集器电感耦合等离子体质谱（LA-MC-ICPMS）进行精确硫同位素分析（δ34S）。岩石学检查和电子探针分析（EMPA）结果证实了IGSD黄铜矿颗粒中主要元素的均匀性。四个SIMS实验室和一个LA-MC-ICPMS实验室的原位分析结果以及整体分析证实了IGSD黄铜矿颗粒中S同位素组成的均匀性。原位分析结果与同位素比值质谱（IRMS）结果一致，在相同的不确定度范围内。这支持了IGSD黄铜矿RM用于原位S同位素分析的适用性。基于IRMS，IGSD黄铜矿RM的推荐δ34S值为4.21±0.23‰（2SD，n=30）。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Atomic Spectroscopy 物理-光谱学

CiteScore

5.30

自引率

14.70%

发文量

审稿时长

4.5 months

期刊介绍： The ATOMIC SPECTROSCOPY is a peer-reviewed international journal started in 1962 by Dr. Walter Slavin and now is published by Atomic Spectroscopy Press Limited (ASPL). It is intended for the rapid publication of both original articles and review articles in the fields of AAS, AFS, ICP-OES, ICP-MS, GD-MS, TIMS, SIMS, AMS, LIBS, XRF and related techniques. Manuscripts dealing with (i) instrumentation & fundamentals, (ii) methodology development & applications, and (iii) standard reference materials (SRMs) development can be submitted for publication.