Effect of Temperature on Monogenic Lines of Wheat Leaf Rust Caused by Puccinia triticina

Abstract

Wheat leaf rust, caused by the fungus Puccinia triticina Eriks., is a destructive disease found throughout common wheat production areas worldwide. Fifty wheat leaf rust monogenic lines were tested with five of Puccinia triticina pathotypes i.e. BJPPQ, LQFDS, PHFPG, PTPDN, TRFDJ at four stable temperatures (30 0C, 25 0C, 20 0C and 15 0C). The wheat monogenic lines viz. Lr 16, Lr 17 and Lr 23 were more resistant at 25 0C, while these genes were found susceptible at 15 0C, 20 0C and 30 0C to all tested races. Eight monogenic lines i.e. Lr11, Lr12, Lr13, Lr14a, Lr18, Lr47, Lr50 and Lr68 displayed temperature sensitivity which were completely resistant at 15 0C and 20 0C. Lr11, Lr12, Lr13, Lr14a, Lr18, Lr47, Lr50 and Lr68 were completely susceptible at 25 0C and 30 0C to all races of Puccinia triticina. Lr 34 showed temperature sensitivity to three of the tested races (LQFDS, PHFPG and PTPDN) which was resistant at 15 0C and 20 0C to, but was susceptible at 25 0C and 30 0C. Genes like Lr1, Lr2a, Lr2b, Lr2c, Lr3ka, Lr3, Lr9, Lr10, Lr14b, Lr15, Lr10+27+31, Lr19, Lr24, Lr28, Lr33, Lr36, Lr39, Lr42, Lr51 and Lr67 were slightly resistant at all temperatures to some races and were susceptible to other races. The other tested monogenic lines were susceptible at all temperatures to all tested races. Further, this study will be helpful to develop resistant cultivars against leaf rust of wheat.